Paper Abstract and Keywords |
Presentation |
2021-11-25 10:55
Investigation of defects suppression in Cu halide thin films by emission spectroscopy Chikashi Fujishima, Kunihiko Tanaka, Kaito Watanabe, Naoya Tujimoto (Nagaoka Univ Tech) ED2021-17 CPM2021-51 LQE2021-29 Link to ES Tech. Rep. Archives: ED2021-17 CPM2021-51 LQE2021-29 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this study, CuBr1-xIx (CuBrI) thin films, which are transparent p-type semiconductors, were deposited on glass substrates by spin coating method. The samples were characterized by transmission spectra, Electron probe micro analysis (EPMA), X-ray diffraction (XRD) and Photoluminescence (PL). The transmission spectra showed that the transmittance was about 80%. EPMA results showed that the bromine in the film did not increase but the iodine increased. The PL results show that the exciton luminescence is enhanced by immersion in the solution, while the luminescence originating from defects is weakened. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
p-type semiconductor / CuBrI / Photoluminescence / solution penetration method / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 121, no. 260, CPM2021-51, pp. 13-18, Nov. 2021. |
Paper # |
CPM2021-51 |
Date of Issue |
2021-11-18 (ED, CPM, LQE) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ED2021-17 CPM2021-51 LQE2021-29 Link to ES Tech. Rep. Archives: ED2021-17 CPM2021-51 LQE2021-29 |
Conference Information |
Committee |
ED CPM LQE |
Conference Date |
2021-11-25 - 2021-11-26 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Online |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
CPM |
Conference Code |
2021-11-ED-CPM-LQE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Investigation of defects suppression in Cu halide thin films by emission spectroscopy |
Sub Title (in English) |
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Keyword(1) |
p-type semiconductor |
Keyword(2) |
CuBrI |
Keyword(3) |
Photoluminescence |
Keyword(4) |
solution penetration method |
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1st Author's Name |
Chikashi Fujishima |
1st Author's Affiliation |
Nagaoka University of Technology (Nagaoka Univ Tech) |
2nd Author's Name |
Kunihiko Tanaka |
2nd Author's Affiliation |
Nagaoka University of Technology (Nagaoka Univ Tech) |
3rd Author's Name |
Kaito Watanabe |
3rd Author's Affiliation |
Nagaoka University of Technology (Nagaoka Univ Tech) |
4th Author's Name |
Naoya Tujimoto |
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Nagaoka University of Technology (Nagaoka Univ Tech) |
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Speaker |
Author-1 |
Date Time |
2021-11-25 10:55:00 |
Presentation Time |
25 minutes |
Registration for |
CPM |
Paper # |
ED2021-17, CPM2021-51, LQE2021-29 |
Volume (vol) |
vol.121 |
Number (no) |
no.259(ED), no.260(CPM), no.261(LQE) |
Page |
pp.13-18 |
#Pages |
6 |
Date of Issue |
2021-11-18 (ED, CPM, LQE) |
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