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Paper Abstract and Keywords
Presentation 2021-11-30 13:50
Extended Error Correction Codes for Burst Errors and Discrete Errors in Small-Scale Circuits
Atsushi Miki (Fujitsu) R2021-36
Abstract (in Japanese) (See Japanese page) 
(in English) Data centers and supercomputers have large configurations. Each unit in the system requires extremely high reliability which is equivalent to several decades of stability to complete applications stably. One of the most common failures in the system is a type of failure in which data error in the memory due to degradation of transistor characteristics or radiation effects, and error correction technology is applied to the memory to prevent such defects. Since the enhancement of the error correction capability of the memory causes an increase in the circuit scale and the data access latency. Therefore, it is desired to correct a wide variety of errors with a low area and low latency. In this paper, we propose an extension code based on 1-byte correction Reed-Solomon codes that are resistant to burst errors. The extension code minimizes the impact on circuit size and latency. And it has correction capability against two types of errors: 1) burst errors that result in multi-bit errors within 1 byte and 2) discrete errors that result in 1-bit errors within two different bytes, which are common error patterns in field service operations. We evaluate its circuit size, latency, and correction capability.
Keyword (in Japanese) (See Japanese page) 
(in English) error correction code / error tendency / composite code / / / / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 276, R2021-36, pp. 13-18, Nov. 2021.
Paper # R2021-36 
Date of Issue 2021-11-23 (R) 
ISSN Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee R  
Conference Date 2021-11-30 - 2021-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability of semiconductor and electronic devices, Reliability ge 
Paper Information
Registration To R 
Conference Code 2021-11-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Extended Error Correction Codes for Burst Errors and Discrete Errors in Small-Scale Circuits 
Sub Title (in English)  
Keyword(1) error correction code  
Keyword(2) error tendency  
Keyword(3) composite code  
1st Author's Name Atsushi Miki  
1st Author's Affiliation Fujitsu Limited (Fujitsu)
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Date Time 2021-11-30 13:50:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2021-36 
Volume (vol) vol.121 
Number (no) no.276 
Page pp.13-18 
Date of Issue 2021-11-23 (R) 

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