| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2021-11-30 13:50 Extended Error Correction Codes for Burst Errors and Discrete Errors in Small-Scale Circuits Atsushi Miki (Fujitsu)  R2021-36 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Data centers and supercomputers have large configurations. Each unit in the system requires extremely high reliability which is equivalent to several decades of stability to complete applications stably. One of the most common failures in the system is a type of failure in which data error in the memory due to degradation of transistor characteristics or radiation effects, and error correction technology is applied to the memory to prevent such defects. Since the enhancement of the error correction capability of the memory causes an increase in the circuit scale and the data access latency. Therefore, it is desired to correct a wide variety of errors with a low area and low latency. In this paper, we propose an extension code based on 1-byte correction Reed-Solomon codes that are resistant to burst errors. The extension code minimizes the impact on circuit size and latency. And it has correction capability against two types of errors: 1) burst errors that result in multi-bit errors within 1 byte and 2) discrete errors that result in 1-bit errors within two different bytes, which are common error patterns in field service operations. We evaluate its circuit size, latency, and correction capability. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | error correction code / error tendency / composite code / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 121, no. 276, R2021-36, pp. 13-18, Nov. 2021. | |
| Paper # | R2021-36 | |
| Date of Issue | 2021-11-23 (R) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | R2021-36 |
|
| Conference Information | |
| Committee | R |
| Conference Date | 2021-11-30 - 2021-11-30 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Reliability of semiconductor and electronic devices, Reliability ge |
| Paper Information | |
| Registration To | R |
| Conference Code | 2021-11-R |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Extended Error Correction Codes for Burst Errors and Discrete Errors in Small-Scale Circuits |
| Sub Title (in English) | |
| Keyword(1) | error correction code |
| Keyword(2) | error tendency |
| Keyword(3) | composite code |
| Keyword(4) | |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Atsushi Miki |
| 1st Author's Affiliation | Fujitsu Limited (Fujitsu) |
| 2nd Author's Name | |
| 2nd Author's Affiliation | () |
| 3rd Author's Name | |
| 3rd Author's Affiliation | () |
| 4th Author's Name | |
| 4th Author's Affiliation | () |
| 5th Author's Name | |
| 5th Author's Affiliation | () |
| 6th Author's Name | |
| 6th Author's Affiliation | () |
| 7th Author's Name | |
| 7th Author's Affiliation | () |
| 8th Author's Name | |
| 8th Author's Affiliation | () |
| 9th Author's Name | |
| 9th Author's Affiliation | () |
| 10th Author's Name | |
| 10th Author's Affiliation | () |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2021-11-30 13:50:00 |
| Presentation Time | 25 minutes |
| Registration for | R |
| Paper # | R2021-36 |
| Volume (vol) | vol.121 |
| Number (no) | no.276 |
| Page | pp.13-18 |
| #Pages | 6 |
| Date of Issue | 2021-11-23 (R) |
[Return to Top Page]