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Paper Abstract and Keywords
Presentation 2021-12-01 14:20
A Dual-mode SAR ADC to Detect Power Analysis Attack
Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2021-30 ICD2021-40 DC2021-36 RECONF2021-38 Link to ES Tech. Rep. Archives: ICD2021-40
Abstract (in Japanese) (See Japanese page) 
(in English) Distributed IoT devices are exposed to unexpected interferences by physical accesses by malicious attackers. An on-chip noise monitor using a dual-mode ADC is developed to detect the insertion of off-chip components as malicious attempts of power noise measurement attacks. Fabricated in 65 nm CMOS, the on-chip noise monitor is examined for the detectability of series resistor, parallel capacitors and voltage probe that are intentionally inserted on power lines.
Keyword (in Japanese) (See Japanese page) 
(in English) power supply noise / side channel attack / power noise attack / electromagnetic noise attack / digital integrated circuit / on-chip noise monitor / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 278, ICD2021-40, pp. 78-82, Dec. 2021.
Paper # ICD2021-40 
Date of Issue 2021-11-24 (VLD, ICD, DC, RECONF) 
ISSN Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2021-30 ICD2021-40 DC2021-36 RECONF2021-38 Link to ES Tech. Rep. Archives: ICD2021-40

Conference Information
Committee VLD DC RECONF ICD IPSJ-SLDM  
Conference Date 2021-12-01 - 2021-12-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2021 -New Field of VLSI Design- 
Paper Information
Registration To ICD 
Conference Code 2021-12-VLD-DC-RECONF-ICD-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Dual-mode SAR ADC to Detect Power Analysis Attack 
Sub Title (in English)  
Keyword(1) power supply noise  
Keyword(2) side channel attack  
Keyword(3) power noise attack  
Keyword(4) electromagnetic noise attack  
Keyword(5) digital integrated circuit  
Keyword(6) on-chip noise monitor  
Keyword(7)  
Keyword(8)  
1st Author's Name Takuya Wadatsumi  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Takuji Miki  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Makoto Nagata  
3rd Author's Affiliation Kobe University (Kobe Univ.)
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Speaker Author-1 
Date Time 2021-12-01 14:20:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # VLD2021-30, ICD2021-40, DC2021-36, RECONF2021-38 
Volume (vol) vol.121 
Number (no) no.277(VLD), no.278(ICD), no.279(DC), no.280(RECONF) 
Page pp.78-82 
#Pages
Date of Issue 2021-11-24 (VLD, ICD, DC, RECONF) 


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