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| Presentation | 2022-03-01 16:10 [Invited Lecture] Enhancement of measurement sensitivity in an internal structure modeling method for silicon waveguides using nonlinear spectral change Tomoya Kurahashi, Masayuki Makino, Ryohei Kamikawa, Tsuyoshi Konishi (Osaka Univ.)  PN2021-64 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The evaluation of the fabrication quality of microfabricated optical devices requires modeling their internal structures along with the propagation axis. Previously, we have proposed an evaluation method for the internal structure models along with the propagation axis based on the accumulated nonlinear spectral change and data assimilation. However, if the spectral change is not sufficient, the assessment error could increase. In this study, we propose a new measurement system for structure modeling to improve its accuracy and confirm its effectiveness. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Silicon photonics / Nonlinear optical effect / Optical devices / Structure modeling / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 121, no. 386, PN2021-64, pp. 60-64, March 2022. | |
| Paper # | PN2021-64 | |
| Date of Issue | 2022-02-22 (PN) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | PN2021-64 |
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| Conference Information | |
| Committee | PN |
| Conference Date | 2022-03-01 - 2022-03-02 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | PN |
| Conference Code | 2022-03-PN |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Enhancement of measurement sensitivity in an internal structure modeling method for silicon waveguides using nonlinear spectral change |
| Sub Title (in English) | |
| Keyword(1) | Silicon photonics |
| Keyword(2) | Nonlinear optical effect |
| Keyword(3) | Optical devices |
| Keyword(4) | Structure modeling |
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| 1st Author's Name | Tomoya Kurahashi |
| 1st Author's Affiliation | Osaka University (Osaka Univ.) |
| 2nd Author's Name | Masayuki Makino |
| 2nd Author's Affiliation | Osaka University (Osaka Univ.) |
| 3rd Author's Name | Ryohei Kamikawa |
| 3rd Author's Affiliation | Osaka University (Osaka Univ.) |
| 4th Author's Name | Tsuyoshi Konishi |
| 4th Author's Affiliation | Osaka University (Osaka Univ.) |
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| Speaker | Author-1 |
| Date Time | 2022-03-01 16:10:00 |
| Presentation Time | 20 minutes |
| Registration for | PN |
| Paper # | PN2021-64 |
| Volume (vol) | vol.121 |
| Number (no) | no.386 |
| Page | pp.60-64 |
| #Pages | 5 |
| Date of Issue | 2022-02-22 (PN) |
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