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Paper Abstract and Keywords
Presentation 2022-04-26 13:55
Evaluation of Electromagnetic Information Leakage Intensity from Displays under Different Usage Environment
Yoshiki Kitamura, Taiki Kitazawa, Daisuke Fujimoto, Yuichi Hayahi (NAIST) HWS2022-5
Abstract (in Japanese) (See Japanese page) 
(in English) The threat of TEMPEST attack which reconstructs the screen information from the electromagnetic leakage caused by operation of display has been reported.
The intensity of electromagnetic leakage from these devices is dependent on the surrounding environment, such as used place and peripheral devices.
Thus, leakage intensity evaluation is required under different usage environments.
In this paper, we clarify the factors that affect the leakage intensity of screen information by altering the surrounding environment of laptop PC.
In this experiment, to evaluate the effect of usage environment on information leakage from laptop PC, we used a method that displays an image containing specific frequency components on amplitude demodulated wave which obtained from received electromagnetic waves and compares their spectrum intensity.
As a result, we confirmed that the leakage intensity changes in the various surrounding environment.
In addition, leakage intensity is increased when we put the laptop PC on a metal plate at a specific leakage frequency.
Keyword (in Japanese) (See Japanese page) 
(in English) TEMPEST / EM information leakage / leakage evaluation / / / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 11, HWS2022-5, pp. 24-27, April 2022.
Paper # HWS2022-5 
Date of Issue 2022-04-19 (HWS) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee HWS  
Conference Date 2022-04-26 - 2022-04-26 
Place (in Japanese) (See Japanese page) 
Place (in English) AIST Tokyo Waterfront (Annex) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Hardware Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2022-04-HWS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of Electromagnetic Information Leakage Intensity from Displays under Different Usage Environment 
Sub Title (in English)  
Keyword(1) TEMPEST  
Keyword(2) EM information leakage  
Keyword(3) leakage evaluation  
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1st Author's Name Yoshiki Kitamura  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Taiki Kitazawa  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Daisuke Fujimoto  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Yuichi Hayahi  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2022-04-26 13:55:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # HWS2022-5 
Volume (vol) vol.122 
Number (no) no.11 
Page pp.24-27 
#Pages
Date of Issue 2022-04-19 (HWS) 


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