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| Paper Abstract and Keywords | ||
| Presentation | 2022-11-16 14:20 Evaluation of fixture correction method of s-parameter measurement for surface mount devices Takashi Kondo, Kohei Fujiwara (TIRI)  MW2022-129 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | A fixture correction is generally involved in s-parameter measurements for surface mount devices in the microwave band. To achieve high precise s-parameter measurements, we evaluated both the TRL calibration and de-embedding method. The former is for producing a calibration surface in the fixture. The latter is for removing the characteristics of the fixture. The measurements were performed using highprecision calibration boards with general-purpose universal test fixture. As a result, it was confirmed that good characteristics is obtained for both correction methods by preparing a high-precision fixture. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Network Analyzer / TRL Calibration / De-embedding / Beatty Line / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 122, no. 250, MW2022-129, pp. 108-112, Nov. 2022. | |
| Paper # | MW2022-129 | |
| Date of Issue | 2022-11-08 (MW) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MW2022-129 |
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| Conference Information | |
| Committee | MW |
| Conference Date | 2022-11-15 - 2022-11-16 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Fukue-Bunka-Kaikan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave, etc. |
| Paper Information | |
| Registration To | MW |
| Conference Code | 2022-11-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of fixture correction method of s-parameter measurement for surface mount devices |
| Sub Title (in English) | |
| Keyword(1) | Network Analyzer |
| Keyword(2) | TRL Calibration |
| Keyword(3) | De-embedding |
| Keyword(4) | Beatty Line |
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| Keyword(8) | |
| 1st Author's Name | Takashi Kondo |
| 1st Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute (TIRI) |
| 2nd Author's Name | Kohei Fujiwara |
| 2nd Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute (TIRI) |
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| Speaker | Author-1 |
| Date Time | 2022-11-16 14:20:00 |
| Presentation Time | 25 minutes |
| Registration for | MW |
| Paper # | MW2022-129 |
| Volume (vol) | vol.122 |
| Number (no) | no.250 |
| Page | pp.108-112 |
| #Pages | 5 |
| Date of Issue | 2022-11-08 (MW) |
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