Paper Abstract and Keywords |
Presentation |
2023-01-24 10:30
Measurement results of soft error tolerance of LPDDR4 SDRAM and GDDR5 SDRAM Motoki Kamibayashi, Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Masanori Hashimoto (Kyoto Univ.) VLD2022-65 RECONF2022-88 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In recent years, as the memory capacity of computer systems has increased,the reliability of the system has decreased.Soft errors are one of the main reasons for the decreased reliability.In this paper, two types of 8Gb DRAM (Dynamic Random Access Memory) were irradiated with neutron beamsto evaluate their soft error tolerance.LPDDR4 SDRAM was used on an FPGA board and GDDR5 SDRAM was used on a GPU board.The results showed that the soft error rates for both DRAMs were around 3 FIT/Gb.In LPDDR4, all of the detected errors were burst errors,and in GDDR5, 38% of the detected errors were burst errors. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Soft Error / DRAM / Burst Error / FPGA / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 122, no. 353, VLD2022-65, pp. 34-39, Jan. 2023. |
Paper # |
VLD2022-65 |
Date of Issue |
2023-01-16 (VLD, RECONF) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2022-65 RECONF2022-88 |
Conference Information |
Committee |
IPSJ-SLDM RECONF VLD |
Conference Date |
2023-01-23 - 2023-01-24 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Raiosha, Hiyoshi Campus, Keio University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
FPGA Applications, etc. |
Paper Information |
Registration To |
VLD |
Conference Code |
2023-01-SLDM-RECONF-VLD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Measurement results of soft error tolerance of LPDDR4 SDRAM and GDDR5 SDRAM |
Sub Title (in English) |
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Keyword(1) |
Soft Error |
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DRAM |
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Burst Error |
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FPGA |
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1st Author's Name |
Motoki Kamibayashi |
1st Author's Affiliation |
Kyoto Institute of Technology (Kyoto Inst. of Tech.) |
2nd Author's Name |
Kazutoshi Kobayashi |
2nd Author's Affiliation |
Kyoto Institute of Technology (Kyoto Inst. of Tech.) |
3rd Author's Name |
Masanori Hashimoto |
3rd Author's Affiliation |
Kyoto University (Kyoto Univ.) |
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Speaker |
Author-1 |
Date Time |
2023-01-24 10:30:00 |
Presentation Time |
25 minutes |
Registration for |
VLD |
Paper # |
VLD2022-65, RECONF2022-88 |
Volume (vol) |
vol.122 |
Number (no) |
no.353(VLD), no.354(RECONF) |
Page |
pp.34-39 |
#Pages |
6 |
Date of Issue |
2023-01-16 (VLD, RECONF) |
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