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Paper Abstract and Keywords
Presentation 2023-03-17 13:25
A Note on Optimal Testcase Generation in Boundary Value Analysis
Xiujing Guo, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.) KBSE2022-65
Abstract (in Japanese) (See Japanese page) 
(in English) In software testing, a protective measure to prevent faults in the code is to ensure that the behavior on the boundary between the sub-domains of the input space is correct. Therefore, designing test cases with boundary value analysis (BVA) can detect more errors and improve test efficiency. This paper presents a novel test set generation method used to semi-automatically generate test cases for software boundaries. In this paper, we combine test coverage and BVA to define a boundary coverage measurement, called Boundary Coverage Distance (BCD). In addition, based on BCD, we consider the optimal test case generation to minimize BCD under the random testing scheme. In the experiment, we exhibit the performance of our method by using seven real programs. We compare the fault detection capabilities of our proposed BCD- based approach with random testing (RT), adaptive random testing (ART), and concolic testing. Results indicate that the BCD-based method can generate test cases around the boundary. Compared with RT and ART, our proposed method can generate test cases that detect more faults. Also, the BCD-based method outperforms the concolic testing in three of the seven real programs tested.
Keyword (in Japanese) (See Japanese page) 
(in English) Software testing / Boundary value analysis / BCD / Testcase Generation / / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 444, KBSE2022-65, pp. 67-72, March 2023.
Paper # KBSE2022-65 
Date of Issue 2023-03-09 (KBSE) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee KBSE  
Conference Date 2023-03-16 - 2023-03-17 
Place (in Japanese) (See Japanese page) 
Place (in English) JMS ASTERPLAZA 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To KBSE 
Conference Code 2023-03-KBSE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Note on Optimal Testcase Generation in Boundary Value Analysis 
Sub Title (in English)  
Keyword(1) Software testing  
Keyword(2) Boundary value analysis  
Keyword(3) BCD  
Keyword(4) Testcase Generation  
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1st Author's Name Xiujing Guo  
1st Author's Affiliation Hiroshima University (Hiroshima Univ.)
2nd Author's Name Hiroyuki Okamura  
2nd Author's Affiliation Hiroshima University (Hiroshima Univ.)
3rd Author's Name Tadashi Dohi  
3rd Author's Affiliation Hiroshima University (Hiroshima Univ.)
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Speaker Author-1 
Date Time 2023-03-17 13:25:00 
Presentation Time 35 minutes 
Registration for KBSE 
Paper # KBSE2022-65 
Volume (vol) vol.122 
Number (no) no.444 
Page pp.67-72 
#Pages
Date of Issue 2023-03-09 (KBSE) 


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