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Paper Abstract and Keywords
Presentation 2023-06-09 16:20
Estimating Transmission Efficiency of Intentional Electromagnetic Interference Using Fault Occurrence Rate from Cryptographic Devices
Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-28
Abstract (in Japanese) (See Japanese page) 
(in English) Fault injection attacks using intentional electromagnetic interference (IEMI) against cryptographic devices have become a powerful attack method due to their ability to operate without requiring physical proximity or alterations to the target device and leaving no trace of the attack. However, under IEMI, it is necessary to induce a fault in the cryptographic module using injection frequencies with high transmission efficiency without causing faults in other modules. This paper proposes a method to estimate such frequencies non-invasively from faulty cipher texts outputted when the cryptographic module fails. Specifically, we focus on the fault occurrence rate of cryptographic module depending on the intensity of the injection wave that has reached it, and we estimate the transmission efficiency of the injection wave to the cryptographic module at each injection frequency. Experimental results using an evaluation board confirmed a good agreement between the transmission efficiency of injection wave estimated by the proposed method and the transmission efficiency measured through an observation port on the evaluation board using a spectrum analyzer.
Keyword (in Japanese) (See Japanese page) 
(in English) Intentional electromagnetic interference / fault injection attacks / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 72, EMCJ2023-28, pp. 82-86, June 2023.
Paper # EMCJ2023-28 
Date of Issue 2023-06-02 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2023-06-09 - 2023-06-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Otaru Chamber of Commerce & Industry 
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC 
Paper Information
Registration To EMCJ 
Conference Code 2023-06-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Estimating Transmission Efficiency of Intentional Electromagnetic Interference Using Fault Occurrence Rate from Cryptographic Devices 
Sub Title (in English)  
Keyword(1) Intentional electromagnetic interference  
Keyword(2) fault injection attacks  
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1st Author's Name Hikaru Nishiyama  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Daisuke Fujimoto  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Yuichi Hayashi  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2023-06-09 16:20:00 
Presentation Time 20 minutes 
Registration for EMCJ 
Paper # EMCJ2023-28 
Volume (vol) vol.123 
Number (no) no.72 
Page pp.82-86 
#Pages
Date of Issue 2023-06-02 (EMCJ) 


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