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Paper Abstract and Keywords
Presentation 2023-10-31 14:20
Evaluation of Time-to-Digital Converter in Laser Fault Injection Detection on FPGA
Shungo Hayashi, Junichi Sakamoto (YNU/AIST), Masaki Chikano, Tsutomu Matsumoto (YNU) HWS2023-56 ICD2023-35
Abstract (in Japanese) (See Japanese page) 
(in English) Fault injection attacks are attacks that intentionally introduce faults into a running device in order to expose internal confidential information. In particular, laser fault injection is an effective fault injection method with high spatial controllability, and can cause both transient and persistent faults in circuits on FPGAs. To counter this threat, some countermeasures have been proposed to detect laser-induced fault injection by using a digital sensor that can only be configured with digital circuits. Time-to-digital converter (TDC) is a digital sensor that converts signal delay into digital value, and has recently been proposed as a sensor for detecting fault injection attacks. However, the effectiveness of TDC for laser fault detection in FPGAs has not been experimentally verified. Therefore, this paper implements a highly resolution TDC using CARRY logic on Kintex-7 FPGA and analyzes its response to laser irradiation to verify the effectiveness of TDC for laser fault detection.
Keyword (in Japanese) (See Japanese page) 
(in English) fault injection attack / laser fault injection / FPGA / time-to-digital converter / digital sensor / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 235, HWS2023-56, pp. 10-15, Oct. 2023.
Paper # HWS2023-56 
Date of Issue 2023-10-24 (HWS, ICD) 
ISSN Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF HWS2023-56 ICD2023-35

Conference Information
Committee ICD HWS  
Conference Date 2023-10-31 - 2023-10-31 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Hardware Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2023-10-ICD-HWS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of Time-to-Digital Converter in Laser Fault Injection Detection on FPGA 
Sub Title (in English)  
Keyword(1) fault injection attack  
Keyword(2) laser fault injection  
Keyword(3) FPGA  
Keyword(4) time-to-digital converter  
Keyword(5) digital sensor  
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1st Author's Name Shungo Hayashi  
1st Author's Affiliation Yokohama National University/National Institute of Advanced Industrial Science and Technology (YNU/AIST)
2nd Author's Name Junichi Sakamoto  
2nd Author's Affiliation Yokohama National University/National Institute of Advanced Industrial Science and Technology (YNU/AIST)
3rd Author's Name Masaki Chikano  
3rd Author's Affiliation Yokohama National University (YNU)
4th Author's Name Tsutomu Matsumoto  
4th Author's Affiliation Yokohama National University (YNU)
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Speaker Author-1 
Date Time 2023-10-31 14:20:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # HWS2023-56, ICD2023-35 
Volume (vol) vol.123 
Number (no) no.235(HWS), no.236(ICD) 
Page pp.10-15 
#Pages
Date of Issue 2023-10-24 (HWS, ICD) 


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