IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2024-12-05 14:50
Evaluation of emission current of TiN coated volcano-structured field emitter array before and after aging
Yusuke Kawasaki, Hidekazu Murata (Meijo Univ.), Hiromasa Murata, Masayoshi Nagao (AIST) ED2024-42
Abstract (in Japanese) (See Japanese page) 
(in English) It was difficult to quantitatively evaluate the effect of aging on the uniformity of emission current from FEA. Observation and counting the number of working tips by using field emission microscope was the only way for that purpose. We achieved quantitative evaluation of the emission uniformity by measuring the emission current of individual tips using a multi-emitter evaluation system and an additional Faraday cup installed in it. It was quantitatively revealed that the aging improves the uniformity of the emission current from FEA.
Keyword (in Japanese) (See Japanese page) 
(in English) Volcano-structured field emitter array / TiN / LEEM/PEEM / Aging / / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 293, ED2024-42, pp. 9-12, Dec. 2024.
Paper # ED2024-42 
Date of Issue 2024-11-28 (ED) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2024-42

Conference Information
Committee ED  
Conference Date 2024-12-05 - 2024-12-06 
Place (in Japanese) (See Japanese page) 
Place (in English) WINC AICHI 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Applications of electron and ion beam, general 
Paper Information
Registration To ED 
Conference Code 2024-12-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of emission current of TiN coated volcano-structured field emitter array before and after aging 
Sub Title (in English)  
Keyword(1) Volcano-structured field emitter array  
Keyword(2) TiN  
Keyword(3) LEEM/PEEM  
Keyword(4) Aging  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yusuke Kawasaki  
1st Author's Affiliation Meijo University (Meijo Univ.)
2nd Author's Name Hidekazu Murata  
2nd Author's Affiliation Meijo University (Meijo Univ.)
3rd Author's Name Hiromasa Murata  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Masayoshi Nagao  
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2024-12-05 14:50:00 
Presentation Time 20 minutes 
Registration for ED 
Paper # ED2024-42 
Volume (vol) vol.124 
Number (no) no.293 
Page pp.9-12 
#Pages
Date of Issue 2024-11-28 (ED) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan