| Conference Information |
| Committee |
SDM |
| Conference Date |
2025-01-29 - 2025-01-29 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
KIT Toranomon Graduate School |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Advanced semiconductor devices and processes (Special feature on IEDM) |
| Paper Information |
| Registration To |
SDM |
| Conference Code |
2025-01-SDM |
| Language |
English (Japanese title is available) |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Understanding the Impact of Bipolar Cycling on Memory Window Narrowing in HZO/Si FeFETs: Role of Hole Trapping and De-trapping Dynamics |
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| 1st Author's Name |
Seong-Kun CHO |
| 1st Author's Affiliation |
The University of Tokyo (Univ. of Tokyo) |
| 2nd Author's Name |
Kasidit Toprasertpong |
| 2nd Author's Affiliation |
The University of Tokyo (Univ. of Tokyo) |
| 3rd Author's Name |
Mitsuru Takenaka |
| 3rd Author's Affiliation |
The University of Tokyo (Univ. of Tokyo) |
| 4th Author's Name |
Shinichi Takagi |
| 4th Author's Affiliation |
The University of Tokyo (Univ. of Tokyo) |
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| Speaker |
Author-1 |
| Date Time |
2025-01-29 14:05:00 |
| Presentation Time |
30 minutes |
| Registration for |
SDM |
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| Volume (vol) |
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| Date of Issue |
2025-01-22 (SDM) |