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Paper Abstract and Keywords
Presentation
Exposure Polarization Dependency of Active Implantable Medical Device EMI in 5G Frequency Band
Takuji Nishikawa, Atsuki Ohtsuka, Takashi Hikage, Manabu Yamamoto (Hokkaido Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) The relationship between electromagnetic interference (EMI) characteristics of implantable medical devices and polarization of RF both under near- and far-fields exposure conditions is investigated using numerical simulation. As a numerical model, we prepare an implantable pacemaker embedded in a human phantom used in EMI evaluation tests and analyze the AIMD-EMI characteristics near the transmitter in the 5G Sub6 frequency band by conducting electromagnetic field simulations based on the finite element method.
Keyword (in Japanese) (See Japanese page) 
(in English) Active Implantable Medical Device / EMI / FEM / Interference voltage / / / /  
Reference Info. IEICE Tech. Rep.
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Conference Information
Committee PEM  
Conference Date 2021-11-29 - 2021-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. (Hybrid by remote) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) 4th International Workshop on Photonics applied to Electromagnetic Measurements in Sapporo 
Paper Information
Registration To PEM 
Conference Code 2021-11-PEM 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Exposure Polarization Dependency of Active Implantable Medical Device EMI in 5G Frequency Band 
Sub Title (in English)  
Keyword(1) Active Implantable Medical Device  
Keyword(2) EMI  
Keyword(3) FEM  
Keyword(4) Interference voltage  
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1st Author's Name Takuji Nishikawa  
1st Author's Affiliation Hokkaido University (Hokkaido Univ.)
2nd Author's Name Atsuki Ohtsuka  
2nd Author's Affiliation Hokkaido University (Hokkaido Univ.)
3rd Author's Name Takashi Hikage  
3rd Author's Affiliation Hokkaido University (Hokkaido Univ.)
4th Author's Name Manabu Yamamoto  
4th Author's Affiliation Hokkaido University (Hokkaido Univ.)
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