Paper Abstract and Keywords |
Presentation |
Uncertainty Evaluation of Optical Electric-Field Probe Calibration for Human Exposure Assessment at 85 kHz Yuto Shimizu (NICT), Eishi Oho (NICT/TUAT), Jerdvisanop Chakarothai, Tomoaki Nagaoka (NICT), Takuji Arima, Toru Uno (TUAT) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The electromagnetic field in the intermediate frequency band (300 Hz–10 MHz) emitted from wireless power transfer (WPT) systems for electric vehicles is relatively strong, and thus human exposure assessment for these systems is required. We have developed an optical electric-field probe calibration method to measure the electric field at 85 kHz in a tissue-equivalent liquid. In this study, we evaluated the uncertainty of the calibration method to ensure the reliability of the calibration. The expanded uncertainty of the calibration method is about 10%. In addition, we analyzed the dominant uncertainty source. From this analysis, the dominant source is the probe position of the z-axis, the uncertainty of which is about 4%. We found that the sources with high uncertainty, including the probe position of the z-axis, are related to the electric field degradation. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
exposure assessment / optical electric-field probe / calibration / uncertainty / / / / |
Reference Info. |
IEICE Tech. Rep. |
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Conference Information |
Committee |
PEM |
Conference Date |
2021-11-29 - 2021-11-30 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hokkaido Univ. (Hybrid by remote) |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
4th International Workshop on Photonics applied to Electromagnetic Measurements in Sapporo |
Paper Information |
Registration To |
PEM |
Conference Code |
2021-11-PEM |
Language |
English |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Uncertainty Evaluation of Optical Electric-Field Probe Calibration for Human Exposure Assessment at 85 kHz |
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exposure assessment |
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optical electric-field probe |
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calibration |
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uncertainty |
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1st Author's Name |
Yuto Shimizu |
1st Author's Affiliation |
NICT (NICT) |
2nd Author's Name |
Eishi Oho |
2nd Author's Affiliation |
NICT/Tokyo University of Agriculture and Technology (NICT/TUAT) |
3rd Author's Name |
Jerdvisanop Chakarothai |
3rd Author's Affiliation |
NICT (NICT) |
4th Author's Name |
Tomoaki Nagaoka |
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NICT (NICT) |
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Takuji Arima |
5th Author's Affiliation |
Tokyo University of Agriculture and Technology (TUAT) |
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Toru Uno |
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Tokyo University of Agriculture and Technology (TUAT) |
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