講演抄録/キーワード |
講演名 |
Calibration of an Optical Electric-Field Probe at Frequencies Below 30 MHz Using a Shortened Monopole Antenna ○Jerdvisanop Chakarothai・Katsumi Fujii・Kanako Wake・Soichi Watanabe(NICT) |
抄録 |
(和) |
There is an increasing use of devices using electromagnetic fields at intermediate frequencies (300 Hz – 10 MHz) such as wireless power transfer (WPT) systems. In order to check their compliance against international standards to assure electromagnetic (EM) emission and human exposure levels, accurate measurements of EM field in the vicinity of the systems are required. In this study, we develop a calibration system for electric-field probes using a shortened monopole antenna as a standard field source, calibrate optical electric-field probes and compare their results with those obtained by using the TEM-cell method. Differences in the calibration factor derived by two different method of the standard field method and TEM-cell method was less than 2 dB for a frequency range from 10 kHz to 5 MHz. |
(英) |
There is an increasing use of devices using electromagnetic fields at intermediate frequencies (300 Hz – 10 MHz) such as wireless power transfer (WPT) systems. In order to check their compliance against international standards to assure electromagnetic (EM) emission and human exposure levels, accurate measurements of EM field in the vicinity of the systems are required. In this study, we develop a calibration system for electric-field probes using a shortened monopole antenna as a standard field source, calibrate optical electric-field probes and compare their results with those obtained by using the TEM-cell method. Differences in the calibration factor derived by two different method of the standard field method and TEM-cell method was less than 2 dB for a frequency range from 10 kHz to 5 MHz. |
キーワード |
(和) |
Monopole antenna / standard field method / optical E-field probe / calibration / / / / |
(英) |
Monopole antenna / standard field method / optical E-field probe / calibration / / / / |
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