Paper Abstract and Keywords |
Presentation |
Field-Plate Length Dependence of 2.4-GHz Rectification Characteristics of Gated-Anode GaN HEMT Based Diode Gen Taguchi, Naoya Kishimoto, Youichi Tsuchiya, Debaleen Biswasa, Ma Qiang (Nagoya Inst. of Tech.), Yuji Ando, Hidemasa Takahashi (Nagoya Univ), Kenji Itoh, Naoki Sakai (Kanazawa Inst. of Tech), Akio Wakejima (Nagoya Inst. of Tech.) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We demonstrate field-plate (FP) length dependence of 2.4-GHz rectification characteristics of gated-anode GaN HEMT based diode (GAD) in which gate and one of ohmic electrodes are short-circuited.
I-V characteristics are identical, i.e, a forward current of 327 mA/mm at an anode voltage of 2 V with Von of 0.47 V and a breakdown voltage of approximately 100 V, with a FP from 0.3 to 2.3 um.
On the other hand, conversion efficiency increases with decrease in the FP length. These results indicate that an anode capacitance appended by the FP increases a switching loss in the GAD. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
GaN HEMT / gated-anode GaN HEMT based diode / field-plate / Microwave wireless power transfer / / / / |
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IEICE Tech. Rep. |
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