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Chair |
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Tomohiro Yoneda (NII) |
Vice Chair |
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Seiji Kajihara (Kyushu Inst. of Tech.) |
Secretary |
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Masato Kitagami (Chiba Univ.), Tomohiro Nakamura (Hitachi) |
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Conference Date |
Fri, Jun 24, 2011 13:00 - 16:50 |
Topics |
Design, Test, Verification |
Conference Place |
Room B3-2 Kikai-shinkou-kaikan Building |
Address |
3-5-8, Shiba-kouen, Ninato-ku, Tokyo 105-0011 Japan |
Transportation Guide |
http://www.jspmi.or.jp/mapright.htm |
Notes on Review |
This article is a technical report without peer review, and its polished version will be published elsewhere. |
Fri, Jun 24 PM 13:00 - 14:30 |
(1) |
13:00-13:30 |
An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults |
Satoshi Fukumoto, Masayuki Arai, Shinya Hara, Kazuhiko Iwasaki (TMU) |
(2) |
13:30-14:00 |
Effective multi-cycle signatures in testable response analyzers |
Yuki Fukazawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) |
(3) |
14:00-14:30 |
A study on path selection results of an adaptive field test with process variation and aging degradation for VLSI |
Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyuushu Univ) |
|
14:30-14:40 |
Break ( 10 min. ) |
Fri, Jun 24 PM 14:40 - 15:40 |
(4) |
14:40-15:40 |
[Invited Talk]
International Conference Report - VTS2011(29th IEEE VLSI Test Symposium) |
Kazumi Hatayama (NAIST) |
|
15:40-15:50 |
Break ( 10 min. ) |
Fri, Jun 24 PM 15:50 - 16:50 |
(5) |
15:50-16:20 |
A don't care identification method with care bit distribution control
-- Application to capture power reduction -- |
Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushu Univ) |
(6) |
16:20-16:50 |
Low Power At-Speed Scan Testing for LOS Scheme by Test Vector Modification |
Kohei Miyase, Yuta Uchinodan, Kazunari Enokimoto (KIT), Yuta Yamato (NAIST), Xiaoqing Wen, Seiji Kajihara (KIT), Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Verazel (Lirmm) |
Announcement for Speakers |
General Talk | Each speech will have 20 minutes for presentation and 10 minutes for discussion. |
Invited Talk | Each speech will have 50 minutes for presentation and 10 minutes for discussion. |
Contact Address and Latest Schedule Information |
DC |
Technical Committee on Dependable Computing (DC) [Latest Schedule]
|
Contact Address |
Masato Kitakami
Graduate School of Advanced Integration Science,
Chiba University
1-33 Yayoi-cho Inage-ku, Chiba 263-8522 JAPAN
TEL/FAX +43.290.3039
E-:fultyba-u |
Last modified: 2011-04-15 23:18:06
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