Tue, Jun 16 PM 14:10 - 16:50 |
(1) |
14:10-14:35 |
A test data reduction method based on scan slice on BAST |
Makoto Nishikiori, Hiroshi Yamazaki, Toshinori Hosokawa, Masayuki Arai (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) |
(2) |
14:35-15:00 |
Study on Fast Bridge Fault Test Generation Based on Critical Area |
Masayuki Arai (Nihon Univ.), Shingo Inuyama, Kazuhiko Iwasaki (Tokyo Metro. Univ.) |
(3) |
15:00-15:25 |
A Method to Identify High Test Power Areas in Layout Design |
Kohei Miyase (Kyutech), Matthias Sauer, Bernd Becker (Univ. Freiburg), Xiaoqing Wen, Seiji Kajihara (Kyutech) |
|
15:25-15:35 |
Break ( 10 min. ) |
(4) |
15:35-16:00 |
A Study on Function Test of Latch-based Asynchronous Pipeline Circuits |
Daiki Toyoshima, Kyohei Terayama, Atsushi Kurokawa, Masashi Imai (Hirosaki Univ.) |
(5) |
16:00-16:25 |
Performance Evaluation of Dependability Improvement Methods for Multiple Core Systems based on Markov Models |
Masashi Imai (Hirosaki Univ.), Tomohiro Yoneda (NII) |
(6) |
16:25-16:50 |
Using binary decision diagrams for constraint handling in test case generation |
Tatsuhiro Tsuchiya (Osaka Univ.) |