Fri, Feb 19 PM 12:30 - 17:00 |
|
12:30-12:35 |
Opening Address ( 5 min. ) |
(1) |
12:35-13:00 |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Modeling of the oscillating mechanism (7) -- |
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (former Keio Univ/Nippon Inst. of Tech.) |
(2) |
13:00-13:25 |
A Study on Improvement for Seal property of Electromechanical Devices
-- The behavior of One-Part Epoxy Resin in a narrow gap -- |
Osamu Otani, Seiji Nakajima, Tomohiro Fukuhara (OMRON Corp.) |
(3) |
13:25-13:50 |
An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (III) |
Makoto Hasegawa (Chitose Inst. of Sci. and Tech.), Yoshiyuki Kohno (Kaneka Corp.) |
|
13:50-14:00 |
Break ( 10 min. ) |
(4) |
14:00-14:25 |
Optical Beam Profiler using Perturbation Interruption Method |
Seiichi Onoda, Keiichi Inoue, Koji Aita, Masayuki Nakano (Watanabe Co., Ltd) |
(5) |
14:25-14:50 |
Accuracy Improvement of BOF/DWPR Temperature Sensing Using a Reference BOF |
Yasutoshi Komatsu, Ryuji Nagai, Keiichi Inoue, Seiichi Onoda (Watanabe Co., Ltd) |
(6) |
14:50-15:15 |
Cut Set Analysis of Fault Tree with Priority AND Gates |
Taijirou Yoneda, Tetsushi Yuge, Nobuyuki Tamura, Shigeru Yanagi (NDA) |
|
15:15-15:20 |
Break ( 5 min. ) |
(7) |
15:20-15:45 |
Observation of wear status of tin plating for automotive connector at initial stage of sliding |
Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Kazuo Iida (Mie Univ.) |
(8) |
15:45-16:10 |
Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance |
Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) |
(9) |
16:10-16:35 |
A Study on growth of hair silver |
Sadanori Ito (Formerly OMRON), Takahumi Sasaki (OMRON), Hiroki Yamaguchi (OMRON RELAY AND DEVUCE) |
(10) |
16:35-17:00 |
Measurement Of Electrical Property Of Sn Oxide Layer Using Liquid Metal |
Tomoki Yonekawa, Yasushi Saitoh, Kazuo Iida, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech. Ltd) |
|
17:00-17:05 |
Closing Address ( 5 min. ) |