Thu, Jul 15 AM 11:00 - 12:20 |
|
11:00-11:05 |
Opening Address ( 5 min. ) |
(1) |
11:05-11:30 |
Evaluation of immunity characteristics for power supply terminal of RF components |
Fujiyuki Nakamoto, Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Mitsubishi Electric Corp.) |
(2) |
11:30-11:55 |
A Proposal of Near-Field-Measurement Technique in Complex Complex |
Toshihiro Takatsu, Fengchao Xiao (Univ. of Electro-comm.), Kimitoshi Murano (Tokai Univ.), Yoshio Kami (Univ. of Electro-comm.) |
(3) |
11:55-12:20 |
Measurement of Cole-Cole Plot for Wine with an Open Ended Coaxial Probe |
Yusuke Sato, Yusuke Kazama, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.) |
|
12:20-13:20 |
Lunch Break ( 60 min. ) |
Thu, Jul 15 PM 13:20 - 15:00 |
(4) |
13:20-13:45 |
Estimation of Whole-Body Average SARs in Human for Vertical Polarized Far-Field Exposure at Frequencies over 1 GHz Using Spatially Averaged Squares of Induced Currents |
Tokio Suzuki, Akimasa Hirata, Osamu Fujiwara (Nagoya Inst. of Tech.), Tomoaki Nagaoka, Soichi Watanabe (NICT) |
(5) |
13:45-14:10 |
Evaluation Method for EMI of an Implanted Device by Wireless Devices Using Near-field EMF |
Satoshi Ishihara, Takahiro Iyama, Teruo Onishi, Yoshiaki Tarusawa (NTT DOCOMO) |
(6) |
14:10-14:35 |
Estimation of Current Sources Magnitude Using Improved SPM Method |
Yuan Zhen, Jerdvisanop Chakarothai, Qiang Chen, Kunio Sawaya (Tohoku Univ.) |
(7) |
14:35-15:00 |
Examination of Reduction Technique for Radiation noise from the power suppy layers in PCB
-- Power supply layers shape -- |
Hitoshi Takakura, Shinichi Sasaki (Saga Univ.) |
|
15:00-15:15 |
Break ( 15 min. ) |
Thu, Jul 15 PM 15:15 - 17:00 |
(8) |
15:15-15:40 |
Effective Position of Decoupling Inductor Taking Parasitic Capacitances on Power Distribution Network Traces into Account |
Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.) |
(9) |
15:40-16:05 |
Selection of position of equivalent current source in LSI linear macro-model using Norton equivalent circuit in transient domain |
Teruyoshi Yamasaki, Hiroshi Tanaka, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) |
(10) |
16:05-16:30 |
Relationship between Contact Point Distribution and Common-Mode Current on Connector with Contact Failure |
Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) |
(11) |
16:30-16:55 |
Time Domain Analysis of Single Conductor Line Using Propagating Line Current |
Yoshinobu Wada, Takashi Hisakado, Osami Wada (Kyotu Univ.) |
|
16:55-17:00 |
Closing Address ( 5 min. ) |