Fri, Feb 20 AM 09:50 - 17:35 |
(1) |
09:50-10:15 |
Contact resistance analysis of electric contact with tin or silver plated layer |
Shigeru Sawada (Mie Univ.), Kaori Shimizu, Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.) |
(2) |
10:15-10:40 |
Growth Law of the Oxide Film Formed on the tin Plated Contact Surface and Its Contact Resistance Characteristic
-- Study applied by ellipsometry -- |
Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.) |
(3) |
10:40-11:05 |
Influence of Aging on Contact Resistance Characteristics of Tin Plated Contacts |
Yuichi Tominaga, Takuya Yamanaka, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.) |
(4) |
11:05-11:30 |
Influence of Fretting Corrosion on Lifetime of Tin Plated Connectors |
Daiji Ito, Hirosaka Ikeda, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (Auto Networks Tech, Ltd) |
|
11:30-12:30 |
Lunch Break ( 60 min. ) |
(5) |
12:30-12:55 |
Microscopy Study of Fretting Corrosion of the Tin Plated Contacts |
Tetsuya Ito, Shigeru Sawada, Yoshiyuki Nomura (ANTAutoNetworks Tech, Ltd.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.) |
(6) |
12:55-13:20 |
An experimental study on evaluation system for contact surraces with an optical-cross method |
Makoto Kashiwakura, Shunsuke Kudo, Asuka Sudo, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) |
(7) |
13:20-13:45 |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- for Contact Resistance (IV) -- |
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio Univ.) |
(8) |
13:45-14:10 |
Pull strength analysis of Pb free solder at a connected point |
Taku Hashiguchi, Yuta Nasukawa, Kazunori Hiraoka (Salesian Polytecn.) |
|
14:10-14:25 |
Break ( 15 min. ) |
(9) |
14:25-14:50 |
Evaluation of electric contact trouble caused by silicone.
-- Evaluation test with new environmental examination device -- |
Makito Morii, Hiroyuki Moriwaki (OMRON), Hideki Tanaka, Yoshitaka Ueki, Kenji Suzuki, Kimio Yoshizumi, Masanobu Nishikawa (espec) |
(10) |
14:50-15:15 |
Dependency of Occurrence of Contact Failure due to Silicone Contamination on Electrical Load Conditions |
Terutaka Tamai (Mie Univ.) |
(11) |
15:15-15:40 |
An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts |
Makoto Hasegawa, Takuma Matsuto (Chitose Inst. of Sci. & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.) |
|
15:40-15:55 |
Break ( 15 min. ) |
(12) |
15:55-16:20 |
* |
Sadanori Ito (Itoken office) |
(13) |
16:20-16:45 |
Avoidance for lightning damages on the stray metal portion of the broadcasting system |
Kazuaki Wakai (Daiichi Univ.), Yuji Sawaguri (SGC) |
(14) |
16:45-17:10 |
Reliability test results for SC and MU connectors installed on outside plant |
Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase (NTT) |
(15) |
17:10-17:35 |
Development of undressing detection system of uniforms by human body communication. (without presentation) |
Akinori Kondo (TMCIT), Sayumi Kamata (TMCAE), Masaki Fujikawa (Chuo Univ.), Kenji Furusawa (Mitsuya Lab.), Masakatsu Nishigaki (Shizuoka Univ.), Masasumi Yoshizawa (TMCIT) |