Thu, Nov 20 PM 13:45 - 16:25 |
(1) |
13:45-14:10 |
Prediction of performance degradation and lifetime for semiconductor devices using markov chain model |
Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.) |
(2) |
14:10-14:35 |
Reliability Analysis for Degradation Process Data Based on Bayesian Methods |
Toru Kaise (Univ. of Hyogo) |
(3) |
14:35-15:00 |
Reliability Analysis for Degradation Processes Based on Stochastic Differential Equations |
Toru Kaise (Univ. of Hyogo) |
|
15:00-15:10 |
Break ( 10 min. ) |
(4) |
15:10-15:35 |
The study about acceleration model of ceramic capacitors by voltage stress |
Toshinari Matsuoka (MELCO) |
(5) |
15:35-16:00 |
Problem of Repeatability about Dew Test and Evaluation Method by Micro Dew Condensation Test |
Mayuko Nishihara, Kazuhiro Hayashinuma (Murata.Co) |
(6) |
16:00-16:25 |
A Study on Evaluation for fretting corrosion |
Sadanori Itou (itoken office) |