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Technical Committee on Electron Devices (ED) (Searched in: 2006)
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Search Results: Keywords 'from:2006-11-24 to:2006-11-24'
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ED, SDM, R |
2006-11-24 13:00 |
Osaka |
Central Electric Club |
[Invited Talk]
Fault diagnosis technology based on transistor behavor analysis Masaru Sanada (KUT) |
[more] |
R2006-31 ED2006-176 SDM2006-194 pp.1-6 |
ED, SDM, R |
2006-11-24 13:45 |
Osaka |
Central Electric Club |
* Shunsuke Kunimatsu, Akifumi Imai (Kyoto Univ.), Kensuke Akiyama (Kanagawa Industrial Technology Center), Yoshihito Maeda (Kyoto Univ.) |
[more] |
R2006-32 ED2006-177 SDM2006-195 pp.7-10 |
ED, SDM, R |
2006-11-24 14:10 |
Osaka |
Central Electric Club |
Takafumi Jonishi, Yuichiro Ando, Yoshihito Maeda (Kyoto Univ.) |
[more] |
R2006-33 ED2006-178 SDM2006-196 pp.11-14 |
ED, SDM, R |
2006-11-24 14:35 |
Osaka |
Central Electric Club |
Hot-carrier reliability in Trench Lateral Power MOSFETs Mutsumi Sawada, Shinichiro Matsunaga (Fuji Electric AT), Masaharu Yamaji, Akio Kitamura (Fuji Electric DT), Naoto Fujishima (Fuji Electric AT) |
[more] |
R2006-34 ED2006-179 SDM2006-197 pp.15-20 |
ED, SDM, R |
2006-11-24 15:15 |
Osaka |
Central Electric Club |
Effects of heterointerface flatness on device performance of InP-based HEMT
-- Reduction of interface roughness scattering using (411)A-oriented substrate -- Issei Watanabe (NICT), Keisuke Shinohara (Rockwell), Takahiro Kitada (Univ.of Tokushima), Satoshi Shimomura (Ehimeiv.), Akira Endoh, Yoshimi Yamashita, Takashi Mimura (Fujitsu Labs.), Satoshi Hiyamizu (Osaka Univ./Nara National College of Tech.), Toshiaki Matsui (NICT) |
[more] |
R2006-35 ED2006-180 SDM2006-198 pp.21-25 |
ED, SDM, R |
2006-11-24 15:40 |
Osaka |
Central Electric Club |
Surface passivation film dependence of 1/f noise characteristic in AlGaN/GaN HEMT Takanori Matsushima, Masahiro Nakajima, Kazuki Nomoto, Masataka Satoh, Tohru Nakamura (Hosei Univ.) |
[more] |
R2006-36 ED2006-181 SDM2006-199 pp.27-31 |
ED, SDM, R |
2006-11-24 16:05 |
Osaka |
Central Electric Club |
Seiya Kasai, Alberto F. Basile, Tamotsu Hashizume (Hokkaido Univ.) |
[more] |
R2006-37 ED2006-182 SDM2006-200 pp.33-38 |
ED, SDM, R |
2006-11-24 16:30 |
Osaka |
Central Electric Club |
Surface Passivation of AlGaN/GaN HFETs by a Sputtered AlN Thin Film Hiroaki Ueno, Tomohiro Murata, Hidetoshi Ishida, Tetsuzo Ueda, Yasuhiro Uemoto, Tsuyoshi Tanaka, Kaoru Inoue (Panasonic) |
[more] |
R2006-38 ED2006-183 SDM2006-201 pp.39-42 |
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