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| Chair |
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Seiji Kajihara (Kyushu Inst. of Tech.) |
| Vice Chair |
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Nobuyasu Kanekawa (Hitachi) |
| Secretary |
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Tomohiro Nakamura (Hitachi), Tatsuhiro Tsuthiya (Osaka Univ.) |
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| Conference Date |
Fri, Jun 22, 2012 13:00 - 17:00 |
| Topics |
Design, Test, Verification |
| Conference Place |
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Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Jun 22 PM
13:00 - 14:15 |
| (1) |
13:00-13:25 |
An evaluation of a don't care filling method to improve fault sensitization coverage  DC2012-9 |
Ryosuke Wakasugi, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyusyu Univ) |
| (2) |
13:25-13:50 |
A Reduction Technique of Input Sequences for Time-Multiplexed On-Chip Path Delay Measurement Using Embedded Delay Measurement Circuit DC2012-10 |
Kentaroh Katoh (TNCT) |
| (3) |
13:50-14:15 |
A Study on Fault Tolerant Test Pattern Generators for Reliable Built-in Self Test DC2012-11 |
Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) |
| |
14:15-14:20 |
Break ( 5 min. ) |
Fri, Jun 22 PM
14:20 - 15:10 |
| (4) |
14:20-15:10 |
[Invited Talk]
Empirical study for signal integrity-defects DC2012-12 |
Hiroshi Takahashi, Yoshinobu Higami (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. Tokushima) |
| |
15:10-15:20 |
Break ( 10 min. ) |
Fri, Jun 22 PM
15:20 - 17:00 |
| (5) |
15:20-15:45 |
Note on Layout-Aware High Accuracy Estimation of Bridge/Open Fault Coverage DC2012-13 |
Masayuki Arai, Yoshihiro Shimizu, Kazuhiko Iwasaki (Tokyo Metro. Univ.) |
| (6) |
15:45-16:10 |
An Evaluation of Low Power BIST Method DC2012-14 |
Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara (Kyutech) |
| (7) |
16:10-16:35 |
On Per-Cell Dynamic IR-Drop Estimation in At-Speed Scan Testing DC2012-15 |
Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue (NAIST) |
| (8) |
16:35-17:00 |
Evaluation of the on-chip temperature and voltage using ring-oscillator-based monitoring circuit and a study for an application to field test DC2012-16 |
Yousuke Miyake, Takuma Sasakawa, Yasuo Sato, Seiji Kajihara (Kyutech), Yukiya Miura (TMU) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Invited Talk | Each speech will have 40 minutes for presentation and 10 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| DC |
Technical Committee on Dependable Computing (DC) [Latest Schedule]
|
| Contact Address |
|
Last modified: 2012-06-15 21:57:43
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