|
|
Technical Committee on Superconductive Electronics (SCE) (Searched in: 2005)
|
|
Search Results: Keywords 'from:2005-10-14 to:2005-10-14'
|
[Go to Official SCE Homepage (Japanese)] |
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SCE |
2005-10-14 13:30 |
Aichi |
Nagoya Univ. |
Study on fabrication of Nb/AlOx/Nb Josephson Junctions with high critical current densities Takashi Sumikura, Hiroyuki Akaike, Akira Fujimaki (Nagoya Univ.) |
We have been studying a fabrication process for high critical current density (Jc) Nb/AlOx/Nb Josephson junctions. To fa... [more] |
SCE2005-18 pp.1-6 |
SCE |
2005-10-14 13:55 |
Aichi |
Nagoya Univ. |
Inductance estimation for some structures by inductance value of a simple line structure Tomohiro Nishino, Yoichi Okabe (Univ. of Tokyo) |
Inductance is an important parameter in the design of Single Flux Quantum (SFQ) circuit, but it takes long time to calcu... [more] |
SCE2005-19 pp.7-12 |
SCE |
2005-10-14 14:20 |
Aichi |
Nagoya Univ. |
Mutual Inductance Coupled through a Superconducting Magnetic Isolation Layer Yoshinao Mizugaki, Hidemitsu Hakii, Masataka Moriya, Kouichi Usami, Tadayuki Kobayashi (UEC) |
Magnetic isolation is an important issue in the realization of Josephson LSIs. Although a subterranean power line struct... [more] |
SCE2005-20 pp.13-17 |
SCE |
2005-10-14 14:55 |
Aichi |
Nagoya Univ. |
AC characteristics of Josephson vortex flow transistors Yasushi Doda, Iwao Kawayama, Hironaru Murakami, Masayoshi Tonouchi (Osaka Univ.) |
[more] |
SCE2005-21 pp.19-23 |
SCE |
2005-10-14 15:20 |
Aichi |
Nagoya Univ. |
Quantitative evaluation of timing jitter for SFQ circuits Masayoshi Terabe (Nagoya Univ.), Akito Sekiya (CREST-JST), Akira Fujimaki (Nagoya Univ.) |
We measured the timing jitter of Josephson transmission lines with the time-to-digital converter (TDC) which can detect ... [more] |
SCE2005-22 pp.25-30 |
|
|
|
[Return to Top Page]
[Return to IEICE Web Page]
|