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Technical Committee on Reliability (R)  (Searched in: 2013)

Search Results: Keywords 'from:2013-06-14 to:2013-06-14'
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 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2013-06-14
13:30		 Tokyo   Degradation diagnosis of LED by junction temperature shift
Yuichi Sumimoto, Kazuya Murakami, Kenji Adachi (Toshiba) R2013-16		 LEDs are used of lighting and sensor in recent industrial equipment. LEDs are energy saving and longevity of lightning, ... [more] R2013-16
pp.1-6
R 2013-06-14
13:55		 Tokyo   A Study of the Cable Failure Diagnosis TDR Method of Network Devices
Takashi Kuwahara, Yoshihiro Akeboshi (Mitsubishi Electric), Seiichi Saito (Salesian Polytechnic) R2013-17		 In a multipoint cable network system connected with many units and complicated wiring structure, it is difficult to find... [more] R2013-17
pp.7-12
R 2013-06-14
14:20		 Tokyo   Black Swan Strategies for Performance Management of Large-Scale Clouds
Marat Zhanikeev (Kyushu Inst. of Tech.) R2013-18		 Cloud services today are not sufficiently big to cause major problems with performance, resilience and availability. Th... [more] R2013-18
pp.13-16
R 2013-06-14
14:45		 Tokyo   Optimal Checkpoint Placement based on System Workload
Yuki Doi, Tadashi Dohi (Hiroshima Univ.) R2013-19		 In this paper we revisit an optimal checkpoint model by Bouguerra, Trystram, Gautier and Vincent (2008, 2010) and develo... [more] R2013-19
pp.17-22
 Results 1 - 4 of 4  /   
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