| Technical Committee on Advanced Testing and Certification Technology for Radio Equipment (ACT) |
[schedule] [select]
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| Chair |
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Hiroyuki Arai (Yokohama National Univ.) |
| Vice Chair |
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Nozomu Ishii (Niigata Univ.) |
| Secretary |
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Yasushi Matsumoto (NICT), Satoru Kurokawa (AIST) |
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| Conference Date |
Fri, Jul 9, 2010 13:30 - 16:25 |
| Topics |
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| Conference Place |
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Fri, Jul 9 PM
13:30 - 16:25 |
| (1) |
13:30-13:55 |
Near field distributions of horn antenna |
Akihiko Komatsuzaki, Hiroyuki Arai (Yokohama Natl. Univ.) |
| (2) |
13:55-14:20 |
Study of Measurement and Evaluation Method of Electromagnetic Field Radiated by Modulated Sources |
Qiang Chen, Toshiki Sayama, Kunio Sawaya (Tohoku Univ.) |
| (3) |
14:20-14:45 |
Influence of Probe Antenna Pattern on Far-Field Measurement by Synthetic Aperture Antenna |
Ryo Yamaguchi, Kazuhiro Komiya, Keizo Cho (NTT DOCOMO) |
| (4) |
14:45-15:10 |
Comparison of Total Radiated Power Measurements for Radio Equipment Integrated with Antenna |
Nozomu Ishii (Niigata Univ.) |
| (5) |
15:10-15:35 |
Analysis of the Influence of Element Position-Error on the Beam-Pattern of Synthetic Cylindrical Array |
Karlisa Priandana, Mir Ghoraishi, Jun-ichi Takada (Tokyo Tech), Michitaka Ameya, Satoru Kurokawa, Masanobu Hirose (AIST) |
| (6) |
15:35-16:00 |
Development of RF Impedance Standards for EMC Test Instruments |
Masahiro Horibe, Masaaki Shida (NMIJ-AIST) |
| (7) |
16:00-16:25 |
Evaluation of SVSWR over Entire Area of Turntable Using Automatic SVSWR Measurement System |
Michitaka Ameya, Satoru Kurokawa (AIST), Ikuo Watanabe, Mikito Yamaguchi, Ryoichi Hasumi (DEVICE) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| ACT |
Technical Committee on Advanced Testing and Certification Technology for Radio Equipment (ACT) [Latest Schedule]
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| Contact Address |
E- :  t-   |
| Announcement |
Latest information will be presented on the homepage:
http://www.ieice.org/~act/ |
Last modified: 2010-06-08 22:36:03
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