|
|
| Chair |
|
Hiroyasu Mawatari (NTT) |
| Vice Chair |
|
Tetsushi Yuge (National Defense Academy) |
| Secretary |
|
Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.) |
| Assistant |
|
Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.) |
|
| Conference Date |
Fri, Jun 17, 2016 13:30 - 15:15 |
| Topics |
Reliability for electronics and electronic devices, Failure analysis, Overall reliability engineering |
| Conference Place |
|
| Sponsors |
This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
|
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| R |
Technical Committee on Reliability (R) [Latest Schedule]
|
| Contact Address |
Hiroyuki Okamura (Hiroshima Univ.)
E- :     l     -u |
Last modified: 2016-04-19 16:56:37
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