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Technical Committee on Reliability (R) [schedule] [select]
Chair Yasushi Kadota (Ricoh)
Vice Chair Hiroyuki Okamura (Hiroshima Univ.)
Secretary Takenori Sakumura (Hosei Univ.), Shinji Inoue (Kansai Univ.)
Assistant Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Shuhei Ota (Kanagawa Univ.)

Conference Date Sat, Nov 30, 2024 12:30 - 16:35
Topics Reliability of semiconductor and electronic devices, Reliability general 
Conference Place  
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R.
Due for Registration Please proceed the payment of registration fee by 3 days before the workshop date.

Sat, Nov 30 PM 
12:30 - 16:35
(1) 12:30-12:55 Optimal inspection planning for a storage system with limited information on faiure time R2024-33 Takeshima Koutarou, Takemoto Yasuhiko (Kinki Univ.)
(2) 12:55-13:20 A Note on Interval Reliability Analysis of Intrusion-Tolerant Systems Using Phase Approximation R2024-34 Junjun Zheng, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
(3) 13:20-13:45 A Method of OSS Reliability Assessment Based on Deep Learning Considering the Stochastic Differential Equation Model of Training Data R2024-35 Yoshinobu Tamura, Shoichiro Miyamoto, Lei Zhou (Yamaguchi Univ.), Shigeru Yamada (Tottori Univ.)
  13:45-13:55 Break ( 10 min. )
(4) 13:55-14:20 On a post-warranty block replacement policy with minimal repair for continuously monitored products within a warranty period R2024-36 Nobuyuki Tamura (Hosei Univ.)
(5) 14:20-14:45 A construction method for prior knowledge in Bayesian reliability analysis using accelerated models R2024-37 Toru Kaise (Univ. of Hyogo)
  14:45-14:55 Break ( 10 min. )
(6) 14:55-15:45 [Invited Talk]
Introduction to research on emerging issues and responses to controller area networks
Satoshi Fukumoto (Tokyo Metropolitan Univ.)
(7) 15:45-16:35 [Invited Talk]
Application of Fast Monte Carlo method to Reliability and Risk Analyses R2024-38
Hiroaki Kanekiyo (Kansai Univ.)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Shinji Inoue (Kansai Univ.)
E--mail: ini-u 


Last modified: 2024-09-11 16:56:17


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