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Technical Committee on Reliability (R)
Chair: Tadashi Dohi (Hiroshima Univ.) Vice Chair: Yasushi Kadota (Ricoh)
Secretary: Hiroyuki Okamura (Hiroshima Univ.), Shinji Inoue (Kansai Univ.)
Assistant: Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Takenori Sakumura (Housei Univ.)

Tue, Nov 30, 2021 13:00 - 15:40


Reliability of semiconductor and electronic devices, Reliability ge

Tue, Nov 30 PM (13:00 - 15:40)

(1) 13:00 - 13:25
A Note on Performance Evaluation of Cloud Datacenters using CPU Utilization Data
Chen Li (Kyutech), Junjun Zheng (Ritsumeikan Univ.), Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)

(2) 13:25 - 13:50
Predicting Vulnerability Discovery Processes in Support Periods for an Operating System
Kento Kubota, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.)

(3) 13:50 - 14:15
Extended Error Correction Codes for Burst Errors and Discrete Errors in Small-Scale Circuits
Atsushi Miki (Fujitsu)

----- Break ( 10 min. ) -----

(4) 14:25 - 14:50
Queueing simulation of faults correction based on software reliability growth models
Yuka Minamino (Tottori Univ.), Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.)

(5) 14:50 - 15:15
Safety Analysis for Safety-Related Software Based on a Fault Detection Count Model
Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab.), Shigeru Yamada (Tottori Univ.)

(6) 15:15 - 15:40
Bayesian Reliability Analysis Based on State Space Models for Monitoring Data
Toru Kaise (Univ. of Hyogo)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.

- This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.

=== Technical Committee on Reliability (R) ===

Sat, Dec 4, 2021: Online [Thu, Oct 14], Topics: Reliability International Standard, Maintainability, Reliability General, Safety General
Thu, Feb 10, 2022: Online [Fri, Dec 10]

Shinji Inoue (Kansai Univ.)
E-mail: ini-u

Last modified: 2021-09-15 18:54:35

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