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Chair |
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Naoto Kaio (Hiroshima Shudo Univ.) |
Vice Chair |
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Hitoshi Watanabe (Tokyo Univ. of Science) |
Secretary |
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Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT) |
Assistant |
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Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy) |
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Conference Date |
Fri, Nov 19, 2010 14:00 - 16:15 |
Topics |
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Conference Place |
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Sponsors |
This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is in cooperation with Reliability Engineering Association of Japan.
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Fri, Nov 19 PM 14:00 - 16:15 |
(1) |
14:00-14:25 |
Evaluation of degradation at a solder connected point due to electromigration |
Akihiro Higuchi, Kazunori Hiraoka (Salesian Poly.) |
(2) |
14:25-14:50 |
Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling |
Yuichi Aoki, Manabu Okamoto (Espec Corp.), Atsushi Masuda, Takuya Doi (AIST) |
(3) |
14:50-15:15 |
The improvement of the sealing reliability of relays by the means of reducing permeability in sealing adhesives |
Tomohiro Fukuhara, Mitsuo Ito, Osamu Otani (OMRON) |
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15:15-15:25 |
Break ( 10 min. ) |
(4) |
15:25-15:50 |
A Bootstrap Software Reliability Assessment Method in the Final Stage of Software Testing Process |
Takaji Fujiwara (Biz3), Mitsuhiro Kimura (Hosei Univ.) |
(5) |
15:50-16:15 |
Inference of Reliability for Degradation Data Based on Stochastic Process Models |
Toru Kaise (Univ. of Hyogo) |
Announcement for Speakers |
General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Contact Address and Latest Schedule Information |
R |
Technical Committee on Reliability (R) [Latest Schedule]
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Contact Address |
Kimura, Mitsuhiro (Hosei Univ.)
TEL 042-387-6116
FAX 042-387-6126
E-: mi |
Last modified: 2010-09-24 15:51:19
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