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Technical Committee on Reliability (R)
Chair: Naoto Kaio (Hiroshima Shudo Univ.) Vice Chair: Hitoshi Watanabe (Tokyo Univ. of Science)
Secretary: Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT)
Assistant: Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy)

Fri, Nov 19, 2010 14:00 - 16:15



Fri, Nov 19 PM (14:00 - 16:15)

(1) 14:00 - 14:25
Evaluation of degradation at a solder connected point due to electromigration
Akihiro Higuchi, Kazunori Hiraoka (Salesian Poly.)

(2) 14:25 - 14:50
Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling
Yuichi Aoki, Manabu Okamoto (Espec Corp.), Atsushi Masuda, Takuya Doi (AIST)

(3) 14:50 - 15:15
The improvement of the sealing reliability of relays by the means of reducing permeability in sealing adhesives
Tomohiro Fukuhara, Mitsuo Ito, Osamu Otani (OMRON)

----- Break ( 10 min. ) -----

(4) 15:25 - 15:50
A Bootstrap Software Reliability Assessment Method in the Final Stage of Software Testing Process
Takaji Fujiwara (Biz3), Mitsuhiro Kimura (Hosei Univ.)

(5) 15:50 - 16:15
Inference of Reliability for Degradation Data Based on Stochastic Process Models
Toru Kaise (Univ. of Hyogo)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.

- This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is in cooperation with Reliability Engineering Association of Japan.

=== Technical Committee on Reliability (R) ===

Fri, Dec 17, 2010: [Thu, Oct 21]
Fri, Feb 18, 2011: Shizuoka Univ. (Hamamatsu) [Tue, Dec 14]

Kimura, Mitsuhiro (Hosei Univ.)
TEL 042-387-6116
FAX 042-387-6126
E-mail: mi

Last modified: 2010-09-24 15:51:19

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