|
|
| Chair |
|
Naoto Kaio (Hiroshima Shudo Univ.) |
| Vice Chair |
|
Hitoshi Watanabe (Tokyo Univ. of Science) |
| Secretary |
|
Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT) |
| Assistant |
|
Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy) |
|
| Conference Date |
Fri, May 13, 2011 13:30 - 17:40 |
| Topics |
|
| Conference Place |
|
Contact
Person |
Prof. Masaru Sanada |
| Sponsors |
This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.
|
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, May 13 PM
13:30 - 17:40 |
| (1) |
13:30-14:10 |
[Invited Talk]
The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations
-- Non-electrical-contact fault localization in LSI chips --  R2011-8 |
Kiyoshi Nikawa (Osaka Univ.), Masatsugu Yamashita (RIKEN), Toru Matsumoto (HPK), Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae (Osaka Univ.) |
| (2) |
14:10-14:35 |
Observation of Vth Distribution of MONOS Flash Memory Using Scanning Nonlinear Dielectric Microscopy R2011-9 |
Koichiro Honda (Fujitsu Labs.), Yasuo Cho (Tohoku Univ.) |
| (3) |
14:35-15:00 |
Crystal structure analysis of Carbon Nanotube Forests by XRD R2011-10 |
Hiroshi Furuta (KUT) |
| (4) |
15:00-15:25 |
Bias-Temperature Instability in Zin Oxide Thin-Film Transistors R2011-11 |
Mamoru Furuta, Takahiro Hiramatsu, Tokiyoshi Matsuda, Takashi Hirao (Kochi Univ. of Tech.), Yudai Kamada, Shizuo Fujita (Kyoto Univ.) |
| |
15:25-15:45 |
Break ( 20 min. ) |
| (5) |
15:45-16:25 |
[Invited Talk]
Failure analysis method using a Laser excitation quasi-electrostatic field sensing technique R2011-12 |
Seigo Ito, Kiyoaki Takiguchi (Tokyo Univ.) |
| (6) |
16:25-16:50 |
Evaluation of defect-tolerance in the quantum-dot cellular automata PLA R2011-13 |
Katsuyoshi Miura, Takayuki Notsu, Koji Nakamae (Osaka Univ) |
| (7) |
16:50-17:15 |
Produce of Yield Analysis System at Semiconductor Manufacture Factory. |
Shingo Himeno (Toshiba Oita Operations) |
| (8) |
17:15-17:40 |
Candidate Fault Portions Detection using CMOS Transistor Operation Point Analysis R2011-14 |
Kazuaki Kishi, Masaru Sanada (KUT) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| R |
Technical Committee on Reliability (R) [Latest Schedule]
|
| Contact Address |
Kimura, Mitsuhiro (Hosei Univ.)
TEL 042-387-6116
FAX 042-387-6126
E- :  m   i |
Last modified: 2011-03-24 13:53:25
|