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Technical Committee on Reliability (R)
Chair: Yasushi Kadota (Ricoh) Vice Chair: Hiroyuki Okamura (Hiroshima Univ.)
Secretary: Takenori Sakumura (Hosei Univ.), Shinji Inoue (Kansai Univ.)
Assistant: Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Shuhei Ota (Kanagawa Univ.)

Thu, Jun 15, 2023 14:15 - 15:30


Reliability General

Thu, Jun 15 PM (14:15 - 15:30)

(1) 14:15 - 14:40
Change-point Detection of Fault Counting Data Based on Anomaly Detection Methodology for Software Reliability Assessment
Shin Danjo, Yuka Minamino, Masashi Kuwano (Tottori Univ), Taku Moriyama (Yokohama City Univ), Shinji Inoue (Kansai Univ)

(2) 14:40 - 15:05
CNN-based cause analysis of metrology data mismatch between multiple CD-SEMs
Naoya Tanahashi, Shintaro Takada (Hitachi)

(3) 15:05 - 15:30
A Note on Acceleration of Perfect Sampling Algorithm for Stochastic Petri Nets with SMT Solver
Hiroyuki Okamura, Sayaka Ando, Tadashi Dohi (Hiroshima Univ.)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.

- This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.

=== Technical Committee on Reliability (R) ===

Fri, Jul 28, 2023: [Thu, May 11], Topics: Reliability Theory, Communication Network Reliability, Reliability General
Thu, Aug 24, 2023 - Fri, Aug 25, 2023: Tohoku university [Fri, Jun 16], Topics: Photodetectors, Modulators, Optical Electrical device packaging and reliability
Thu, Sep 28, 2023: [Wed, Jul 12], Topics: Reliability of Information Communication System, Reliability General

Shinji Inoue (Kansai Univ.)
E-mail: ini-u

Last modified: 2023-04-14 10:01:35

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