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Chair |
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Yoshiteru Abe (NTT) |
Secretary |
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Yuichi Hayashi (NAIST), Masato Mizukami (Muroran Inst. of Tech.) |
Assistant |
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Yoshiki Kayano (Univ. of Electro-Comm.) |
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Chair |
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Tetsushi Yuge (National Defense Academy) |
Vice Chair |
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Akira Asato (Fujitsu) |
Secretary |
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Nobuyuki Tamura (Hosei Univ.), Shigeto Hiraguri (RTRI) |
Assistant |
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Shinji Inoue (Kansai Univ.), Hiroyuki Okamura (Hiroshima Univ.) |
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Conference Date |
Fri, Feb 16, 2018 13:30 - 15:25 |
Topics |
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Conference Place |
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Sponsors |
This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Electronics Packaging Society, IEEE Reliability Society Japan Chapter.
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Fri, Feb 16 PM 13:30 - 15:25 |
(1) |
13:30-13:55 |
Friction and Contact Resisatnce of Tin Plated Contacts with Lubricant |
Atsushi Shimizu, Yasushi Saitoh (AutoNetworks Tech.) |
(2) |
13:55-14:20 |
Influence of Wear Load on Fretting Corrosion Behavior of Silver Plating Films on Copper Alloys Plates |
Song-zhu Kure-chu (Nagoya Inst. of Tech.), Nobuhiro Kawakami (Iwate Univ.), Yongda YE (Nagoya Inst. of Tech.), Hitoshi Yashiro (Iwate Univ.), Kingo Furukawa, Yasushi Saitoh (AutoNetworks Tech.), Tomoyuki Sakata (SWS) |
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14:20-14:35 |
Break ( 15 min. ) |
(3) |
14:35-15:00 |
Terminal Plating to Lower the Insertion Force of Multiway Connectors |
Akihiro Katoh (AutoNetworks Tech.), Hajime Watanabe (SWS), Yoshifumi Saka, Kingo Furukawa, Yasushi Saitoh (AutoNetworks Tech.), Tomoyuki Sakata (SWS) |
(4) |
15:00-15:25 |
Simultaneous Observation of Break Arcs from Two Directions by High Speed Cameras when a 48VDC/270A resistive circuit is interrupted |
Ryuichi Takano, Junya Sekikawa (Shizuoka Univ.) |
Announcement for Speakers |
General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Contact Address and Latest Schedule Information |
EMD |
Technical Committee on Electromechanical Devices (EMD) [Latest Schedule]
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Contact Address |
Yoshiteru Abe(NTT)
TEL +81-29-868-6129,FAX +81-29-868-6142
E-: abe
Yuichi Hayashi(NAIST)
TEL +81-743-72-5390,FAX +81-743-72-5391
E-: -iisist
Masato Mizukami(Muroran Institute of Technology)
TEL&FAX +81-143-46-5307
E-: m-mmmn-it
Yoshiki Kayano(Univ. of Electro-Comm.)
TEL&FAX +81-42-443-5233
E-: yc |
Announcement |
Latest information will be presented on the homepage:
http://www.ieice.org/es/emd/jpn/ |
R |
Technical Committee on Reliability (R) [Latest Schedule]
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Contact Address |
Hiroyuki Okamura (Hiroshima Univ.)
E-: l-u |
Last modified: 2018-02-08 14:14:15
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