Wed, Feb 27 AM 09:00 - 10:40 |
(1) |
09:00-09:25 |
Note on Target Fault Selection for 2-Pattern Test Generation Considering Critical Area |
Naoya Uchiyama, Masayuki Arai (Nihon Univ.) |
(2) |
09:25-09:50 |
Variational Autoencoder-Based Efficient Test Escape Detection |
Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) |
(3) |
09:50-10:15 |
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors |
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) |
(4) |
10:15-10:40 |
Analysis of the hotspot distribution in the LSI |
Yudai Kawano, Kohei Miyase (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech) |
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10:40-10:55 |
Break ( 15 min. ) |
Wed, Feb 27 AM 10:55 - 12:10 |
(5) |
10:55-11:20 |
Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test |
Tomoki Mino, Shintani Michihiro, Michiko Inoue (NAIST) |
(6) |
11:20-11:45 |
A built-in self-diagnosis mechanism based on self-generation of expected signatures |
Yushiro Hiramoto, Satoshi Ohtake (Oita Univ.), Hiroshi Takahashi (Ehime Univ.) |
(7) |
11:45-12:10 |
An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling |
Foisal Ahmed, Michihiro Shintani, Michiko Inoue (NAIST) |
|
12:10-13:40 |
Break ( 90 min. ) |
Wed, Feb 27 PM 13:40 - 14:55 |
(8) |
13:40-14:05 |
State Assignment Method to Improve Transition Fault Coverage for Datapath |
Masayoshi Yoshimura (Kyoto Sangyo Univ.), Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.) |
(9) |
14:05-14:30 |
FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing |
Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) |
(10) |
14:30-14:55 |
A Compaction Method for Test Sensitization State in Controllers |
Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.) |
|
14:55-15:10 |
Break ( 15 min. ) |
Wed, Feb 27 PM 15:10 - 16:50 |
(11) |
15:10-15:35 |
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines |
Yuki Maeda, Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue (Hiroshima City Univ.) |
(12) |
15:35-16:00 |
Improvement of Flip-Flop Performance Considering the Influence of Power Supply Noise |
Yuya Kinoshita, Yukiya Miura (Tokyo Metropolitan Univ.) |
(13) |
16:00-16:25 |
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(14) |
16:25-16:50 |
Reliability evaluation of the optical navigation electronics of HAYABUSA2
-- Onboard demonstration of a high reliability system with limited resources -- |
Hiroki Hihara (NECSpace/NEC), Junpei Sano (NECSpace), Tetsuya Masuda (NEC), Hisashi Otake, Tatsuaki Okada, Naoko Ogawa, Yuichi Tsuda (JAXA) |