IEICE Technical Committee Submission System
Advance Program
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top  Go Back   Prev R Conf / Next R Conf [HTML] / [HTML(simple)] / [TEXT]  [Japanese] / [English] 

Technical Committee on Reliability (R) [schedule] [select]
Chair Yasushi Kadota (Ricoh)
Vice Chair Hiroyuki Okamura (Hiroshima Univ.)
Secretary Takenori Sakumura (Hosei Univ.), Shinji Inoue (Kansai Univ.)
Assistant Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Shuhei Ota (Kanagawa Univ.)

Conference Date Fri, Jul 28, 2023 10:35 - 16:20
Topics Reliability Theory, Communication Network Reliability, Reliability General 
Conference Place  
Prof. Xiao Xiao (TMU)
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R.

Fri, Jul 28 AM 
10:35 - 16:20
  10:35-10:45 Opening Address ( 10 min. )
(1) 10:45-11:10 Algorithm for stochastic flow network interdiction problem R2023-10 Kazuki Hayashi, Natsumi Takahashi, Tetsushi Yuge (NDA)
(2) 11:10-11:35 A study on reliability evaluation of a linear consecutive-k-out-of-n: G system subject to shocks R2023-11 Lei Zhou (Yamaguchi Univ.), Hisashi Yamamoto (Tokyo Metropolitan Univ.)
(3) 11:35-12:00 Variable neighborhood descent method based on degree centrality for the network topology design with minimum cost subject to a reliability constraint R2023-12 Taishin Nakamura (Tokai Univ.), Koji Shingyochi (Jumonji Univ.)
  12:00-14:00 Lunch Break ( 120 min. )
(4) 14:00-14:25 Application of Wavelet Shrinkage Estimation in Software Reliability Prediction Using Neural Network R2023-13 Wataru Zama, Xiao Xiao (Tokyo Metropolitan Univ.)
(5) 14:25-14:50 A Note on Prediction of Source Code Changes with NLP Models R2023-14 Yuto Kaibe, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
  14:50-15:05 Break ( 15 min. )
(6) 15:05-15:30 Balancing Cost for Periodic Replacement Policies with Minimal Repair R2023-15 Satoshi Mizutani, Toshio Nakagawa (AIT)
(7) 15:30-15:55 Deep Learning Approach for OSS Reliability Assessment Based on Data Preprocessing Considering the Wiener Process R2023-16 Yoshinobu Tamura (Yamaguchi Univ.), Shigeru Yamada (Tottori Univ.)
(8) 15:55-16:20 Proposal for Obtaining Quisu-Optimal Arrangement of the 3-dimensional-consecutive-(r_1,r_2,r_3)-out-of-(n_1,n_2,n_3):F system R2023-17 Tomoaki Akiba (CIT)
  16:20-16:30 Closing Address ( 10 min. )

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Shinji Inoue (Kansai Univ.)
E--mail: ini-u 

Last modified: 2023-05-12 18:17:55

Notification: Mail addresses are partially hidden against SPAM.

[Download Paper's Information (in Japanese)] <-- Press download button after click here.
[Cover and Index of IEICE Technical Report by Issue]

[Presentation and Participation FAQ] (in Japanese)

[Return to R Schedule Page]   /  
 Go Top  Go Back   Prev R Conf / Next R Conf [HTML] / [HTML(simple)] / [TEXT]  [Japanese] / [English] 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan