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電子デバイス研究会(ED) [schedule] [select]
専門委員長 橋詰 保 (北大)
副委員長 加地 徹 (豊田中研)
幹事 原 直紀 (富士通研), 津田 邦男 (東芝)
幹事補佐 須原 理彦 (首都大東京), 上田 哲三 (パナソニック)

シリコン材料・デバイス研究会(SDM) [schedule] [select]
専門委員長 遠藤 哲郎 (東北大)
副委員長 奈良 安雄 (富士通マイクロエレクトロニクス)
幹事 小野 行徳 (NTT), 大西 克典 (九工大)
幹事補佐 野村 晋太郎 (筑波大)

日時 2010年 6月30日(水) 09:40 - 17:30
2010年 7月 1日(木) 09:30 - 13:05
2010年 7月 2日(金) 09:30 - 16:50
議題 第18回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2010) 
会場名 東京工業大学 大岡山キャンパス 
住所 〒152-8550 東京都目黒区大岡山2-12-1
交通案内 東京急行 大井町線・目黒線 大岡山駅下車 徒歩1分
http://www.titech.ac.jp/about/campus/index.html
会場世話人
連絡先
大学院理工学研究科 宮本 恭幸
03-5734-2572
他の共催 ◆The Institute of Electronics Engineers of Korea (IEEK),Global COE Program “Photonics Integration-Core Electronics”(東京工業大学) 共催

  09:30-09:40 委員長挨拶 ( 10分 )
6月30日(水) 午前  -Plenary Session 1-
09:40 - 10:30
(1) 09:40-10:20 [基調講演]Challenge for electromechanical logic systems using compound semiconductor heterostructures ○Hiroshi Yamaguchi・Imran Mahboob・Hajime Okamoto・Koji Onomitsu(NTT)
  10:20-10:30 休憩 ( 10分 )
6月30日(水) 午前  -Session 1A : Emerging Device Technology 1-
10:30 - 14:25
(1) 10:30-10:55 [招待講演]Nano-Electromechanical (NEM) Nonvolatile Memory for Low-Power Electronics ○Woo Young Choi(Sogang Univ.)
(2) 10:55-11:20 [招待講演]Dual-gate ZnO thin-film transistors with SiNx as Dielectric Layer Young Su Kim・Min Ho Kang(National Nanofab Center)・Kang Suk Jeong(Chungnam National Univ.)・Jae Sub Oh・Dong Eun Yoo(National Nanofab Center)・Hi Deok Lee・○Ga-Won Lee(Chungnam National Univ.)
(3) 11:20-11:45 [招待講演]Piezoelectric material based passive RFID tags ○Hyunchul Bae・Jaekwon Kim・Jinwook Burm(Sogang Univ.)
  11:45-12:00 休憩 ( 15分 )
(4) 12:00-12:25 [招待講演]Low-temperature Epitaxial Growth of Ferromagnetic Silicide for SiGe Based Spintransistors ○Masanobu Miyao(Kyushu Univ.)・Kohei Hamaya(Kyushu Univ./JST)
(5) 12:25-12:50 [招待講演]Toward high-efficiency thin-film solar cells using semiconducting BaSi2 ○Takashi Suemasu・Mitsutaka Saito・Atsushi Okada・Katsuaki Tou・Ajimal Khan(Univ. of Tsukuba.)・Noritaka Usami(Tohoku Univ.)
(6) 12:50-13:15 [招待講演]Applications of Smart Cut(TM) Technologies to III-V Based Engineered Substrates ○Makoto Yoshimi(Soitec)
  13:15-14:25 昼食 ( 70分 )
6月30日(水) 午後  -Session 2A : Memory 1-
14:25 - 15:40
(1) 14:25-14:40 A New Cone-Type 1T DRAM Cell ○Gil Sung Lee・Doo-Hyun Kim・Jang-Gn Yun・Jung Hoon Lee・Yoon Kim・Jong-Ho Lee・Hyungcheol Shin・Byung-Gook Park(Seoul National Univ.)
(2) 14:40-14:55 Dependence of Ag film thickness on Formation of Ag Nano-crystals to Fabricate Polymer Nonvolatile Memory ○Jong-Dae Lee・Hyun-Min Seung・Kyoung-Cheol Kwon・Jea-Gun Park(Hanyang Univ.)
(3) 14:55-15:10 The Impact of H2 Anneal on Resistive Switching in Pt/TiO2/Pt Structure ○Guobin Wei・Yuta Goto・Akio Ohta・Katsunori Makihara・Hideki Murakami・Seiichiro Higashi・Seiichi Miyazaki(Hiroshima Univ.)
(4) 15:10-15:25 Threshold Voltage Roll-off Mechanisms in SONOS Flash Memory in Retention Mode Including Trapped Charge Redistribution Effect ○Doo-Hyun Kim・Gil Sung Lee・Seongjae Cho・Jung Hoon Lee・Jang-Gn Yun・Dong Hua Li・Yoon Kim・Se Hwan Park・Won Bo Shim・Wandong Kim・Byung-Gook Park(Seoul National Univ.)
  15:25-15:40 休憩 ( 15分 )
6月30日(水) 午後  -Session 3A : Emerging Device Technology 2-
15:40 - 17:25
(1) 15:40-15:55 Vertical Organic Field Effect Transistors with an Additional Gate Insulation Structure between Active Layer and Gate Electrode ○Donghyun Kim・Jaewook Jeong・Yongtaek Hong(Seoul National Univ.)
(2) 15:55-16:10 Investigation of n-type pentacene based MOS diodes with ultra-thin metal interface layer ○Young uk Song・Shun-ichiro Ohmi(Tokyo Inst. of Tech.)
(3) 16:10-16:25 Fundamental oscillations at ~900 GHz with low bias voltages in RTDs having spike-doped structures ○Safumi Suzuki・Kiyohito Sawada・Atsushi Teranishi・Masahiro Asada(Tokyo Inst. of Tech.)・Hiroki Sugiyama・Haruki Yokoyama(NTT)
(4) 16:25-16:40 Analysis of low loss and wideband characteristics for monolithic isolators using resonant tunneling diodes ○Nobuhiko Tanaka・Mitsufumi Saito・Michihiko Suhara(Tokyo Metro. Univ.)
(5) 16:40-16:55 Investigation of Abnormal Drain Current Increase of Tunneling Field-Effect Transistors ○Min Jin Lee・Woo Younhg Choi(Sogang Univ.)
(6) 16:55-17:10 A design of Novel IGBT with Oblique Trench Gate Juhyun Oh・Dae Hwan Chun(Koria Univ.)・Eui Bok Lee(Koria Univ./KIST)・○Young Hwan Kim・Chun Keun Kim(KIST)・Byeong Kwon Ju・Man Young Sung(Koria Univ.)・Yong Tae Kim(KIST)
(7) 17:10-17:25 Electrical Characteristics of Atomic Layer Deposited Tungsten Nitride Diffusion Barrier for Cu Interconnects ○Yong Tae Kim(KIST)・Eui Bok Lee(Koria Univ./KIST)・Young Hwan Kim・Chun Keun Kim(KIST)・Byeong Kwon Ju(Koria Univ.)
6月30日(水) 午後  -Session 2B : Graphene and ?-?s-
14:25 - 16:30
(1) 14:25-14:50 [招待講演]Synthesis of wafer scale graphene layer for future electronic devices ○Byung Jin Cho・Jeong Hun Mun(KAIST)
(2) 14:50-15:15 [招待講演]Graphene channel FET: A New Candidate for High-Speed Devices ○Tetsuya Suemitsu(Tohoku Univ.)
(3) 15:15-15:30 Deoxyribonucleic Acid Sensitive Graphene Field-Effect Transistors ○J. S. Hwang・H. T. Kim(Korea Univ.)・J. H. Lee・D. M. Whang(Korea Univ./Sungkyunkwan Univ.)・S. W. Hwang(Korea Univ.)
(4) 15:30-15:45 Fabrication of InP/InGaAs DHBTs with buried SiO2 wires ○Naoaki Takebe・Takashi Kobayashi・Hiroyuki Suzuki・Yasuyuki Miyamoto・Kazuhito Furuya(Tokyo Inst. of Tech.)
(5) 15:45-16:00 Reliability study on the emitter-base junction for high-speed sub-micron InP HBTs ○Yoshino K. Fukai・Kenji Kurishima・Norihide Kashio・Shoji Yamahata(NTT Photonics Labs.)
(6) 16:00-16:15 Electrochemical formation of InP porous structures for their application to photoelectric conversion devices ○Hiroyuki Okazaki・Taketomo Sato・Naoki Yoshizawa・Tamotsu Hashizume(Hokkaido Univ)
  16:15-16:30 休憩 ( 15分 )
6月30日(水) 午後  -Session 3B : High Speed and High Frequency Applications 1-
16:30 - 17:30
(1) 16:30-16:45 50-Gbit/s MUX/DEMUX IC modules using feed-trough type metal-wall package technique ○Satoshi Tsunashima・Michihiro Hirata・Koichi Murata(NTT Corp.)
(2) 16:45-17:00 94-GHz Monolithic Down-Converter for FMCW Radar Sensor using Metamorphic HEMTs ○Yong-Hyun Baek・Sang-Jin Lee・Tae-Jong Baek・Seok-Gyu Choi・Min Han・Dong-Sik Ko・Jin-Koo Rhee(Dongguk Univ.)
(3) 17:00-17:15 A Sub-Harmonic RF Transmitter Architecture with Simultaneous Power Combination and LO Leakage Cancellation ○Bongsub Song(Sogang Univ.)・Dohyung Kim(Samsung Electronics)・Jinwook Burm(Sogang Univ.)
(4) 17:15-17:30 RF Interconnect Technology for On-Chip and Off-Chip Communication ○Jongsun Kim(Hongik Univ.)・B. Byun・M.Frank Chang(Univ. of California)
7月1日(木) 午前  -Plenary Session 2-
09:30 - 10:20
(1) 09:30-10:10 [基調講演]Future perspective for the mainstream CMOS technology and their contribution to green technologies ○Hiroshi Iwai(Tokyo Inst. of Tech.)
  10:10-10:20 休憩 ( 10分 )
7月1日(木) 午前  -Session 4A : Channel Engineering-
10:20 - 11:50
(1) 10:20-10:45 [招待講演]High Transport Si/SiGe Heterostructures for CMOS Transistors with Orientation and Strain Enhanced Mobility ○Jungwoo Oh・J. Huang・I. Ok・S. H. Lee・P. D. Kirsch・R. Jammy・Hi-Deok Lee(SEMATECH)
(2) 10:45-11:10 [招待講演]III-V/Ge CMOS technologies and heterogeneous integrations on Si platform ○Shinichi Takagi・Mitsuru Takenaka(Univ. of Tokyo.)
(3) 11:10-11:35 [招待講演]Stress and Surface Orientation Engineering in Scaled CMOSFETs Considering High-Field Carrier Transport ○Masumi Saitoh・Yukio Nakabayashi(Toshiba)・Ken Uchida(Tokyo Inst. of Tech.)・Toshinori Numata(Toshiba)
  11:35-11:50 休憩 ( 15分 )
7月1日(木) 午前  -Session 5A : Emerging Device Technology 3-
11:50 - 13:05
(4) 11:50-12:15 [招待講演]Si single-dopant devices and their characterization ○Michiharu Tabe・Daniel Moraru・Earfan Hamid・Miftahul Anwar・Arief Udhiarto・Ryusuke Nakamura・Sakito Miki・Takeshi Mizuno(Shizuoka Univ.)
(5) 12:15-12:40 [招待講演]Investigation on fabrication of nanoscale patterns using laser interference lithography ○Jinnil Choi・Jung Ho・Ki-Young Dong・Eun-Mi Park・Byeong-Kwon Ju(Korea Univ.)
(6) 12:40-13:05 [招待講演]Bottom-up synthesis of metal-free elementary semiconductor nanowires ○Dongmok Whang(Sungkyunkwan Univ.)・Sung Woo Hwang(Koria Univ.)
7月2日(金) 午前  -Session 6A : TFTs and Sensors-
09:30 - 11:15
(1) 09:30-09:45 Fabrication of Oxide Thin Film Transistor based on SOG dielectric and solution ZnO ○Jung Ho Park・Jinnil Choi・Seongpil Chang・Ki-Young Dong・Eun-Mi Park・Byeong-Kwon Ju(Univ. of Korea)
(2) 09:45-10:00 Device Simulation of Amorphous Indium-Gallium-Zinc-Oxide Thin Film transistors with various interfacial Dielectric layers ○Hyo-seong Seong・Ji-hoon Son・Woo-sung Kim・Hong-seung Kim(Korea Maritime Univ.)・Woo-seok Cheong(ETRI)・Nak-won Jang(Korea Maritime Univ.)
(3) 10:00-10:15 Acivation behaviour for doped Si films after laser or furnace annealing Takashi Noguchi・○Toshiharu Suzuki(Univ. of Ryukyus)
(4) 10:15-10:30 Strain effects in resistor stress sensor fabricated on (001) silicon and their influences on the determination of piezoresistive coefficients ○Chun-Hyung Cho・Ho-Young Cha(Hongik Univ.)
(5) 10:30-10:45 Fabrication of gas sensor using pd doped SnO2 nanotubes ○Ki-Young Dong・In-Sung Hwang・Dae-Jin Ham・Jinnil Choi・Jung-Ho Park・Jong-Heun Lee・Byeong-Kwon Ju(Korea Univ.)
(6) 10:45-11:00 Analysis of Transfer Gate in CMOS Image Sensor ○Seonghyung Park・Hyuk-Min Kwon・Jung-Deuk Bok・In-Shik Han・Woonil Choi・Hi-Deok Lee(Chungnam National Univ)
  11:00-11:15 休憩 ( 15分 )
7月2日(金) 午前  -Session 7A : Gate Oxides-
11:15 - 14:15
(1) 11:15-11:30 Interaction of bis-diethylaminosilane with hydroxylized Si (001) surface for SiO2 thin-film growth using density functional theory ○Seung-Bin Baek・Dae-Hee Kim(Korea Univ. of Tech. and Edu.)・Yong-Chan Jeong(ASM Genitech)・Yeong-Cheol Kim(Korea Univ. of Tech. and Edu.)
(2) 11:30-11:45 Electrical and structural properties of metal oxide semiconductor (MOS) devices with Pt/Ta2O5 gate stacks ○Hoon-Ki Lee・Jagadeesh Chandra・Kyu-Hwan Shim(Chonbuk National Univ.)・Hyung-Joong Yun・Jouhahn Lee(KBSI)・Chel-Jong Choi(Chonbuk National Univ.)
(3) 11:45-12:00 Modulation of PtSi work function by alloying with low work function metal ○Jun Gao・Jumpei Ishikawa・Shun-ichiro Ohmi(Tokyo Inst. of Tech.)
(4) 12:00-12:15 The Analysis of Temperature Dependency of the Mobility In High-k/Metal Gate MOSFET and the Performance on its CMOS Inverter ○Takeshi Sasaki・Takuya Imamoto・Tetsuo Endoh(Tohoku Univ.)
(5) 12:15-12:30 High Integrity Gate Insulator Films on Atomically Flat Silicon Surface ○Xiang Li・Rihito Kuroda・Tomoyuki Suwa・Akinobu Teramoto・Shigetoshi Sugawa・Tadahiro Ohmi(Tohoku Univ.)
(6) 12:30-12:45 Characterization of Mg Diffusion into HfO2/SiO2/Si(100) Stacked Structures and Its Impact on Detect State Densities ○Akio Ohta・Daisuke Kanme・Hideki Murakami・Seiichiro Higashi・Seiichi Miyazaki(Hiroshima Univ.)
(7) 12:45-13:00 Evaluation of 1/f Noise Characteristics in High-k/Metal Gate and SiON/Poly-Si Gate MOSFET ○Takuya Imamoto・Takeshi Sasaki・Tetsuo Endoh(Tohoku Univ.)
  13:00-14:15 昼食 ( 75分 )
7月2日(金) 午後  -Session 8A : Memory 2-
14:15 - 16:50
(1) 14:15-14:40 [招待講演]High-k materials and poly-Si nanowires in nonvolatile memory for 3D flash memory and display panel applications ○Yung-Chun Wu・Min-Feng Hung・Jiang-Hung Chen・Lun-Chun Chen・Ji-Hong Jiang(National Tsing Hua Univ. Taiwan)
(2) 14:40-15:05 [招待講演]A Single Element Phase Transition Memory Sang-Hyeon Lee・○Moonkyung Kim(Cornell Univ.)・Byung-ki Cheong(KIST)・Jooyeon Kim(Ulsan College)・Jo-Won Lee(National Program for Tera-level Nano Devices, Korea)・Sandip Tiwari(Cornell Univ.)
(3) 15:05-15:20 Impact of Floating Body type DRAM with the Vertical MOSFET ○Yuto Norifusa・Tetsuo Endoh(Tohoku Univ./JST)
  15:20-15:35 休憩 ( 15分 )
(4) 15:35-15:50 Independent Gate Twin-bit SONOS Flash Memory with Split-gate Effect ○Yoon Kim・Jang-Gn Yun・Jung Hoon Lee・Gil Sung Lee・Se Hwan Park・Jong-Ho Lee・Hyungcheol Shin・Byung-Gook Park(Seoul National Univ.)
(5) 15:50-16:05 Theoretical Study of the Hydrogen Effect on the Program/Erase Cycle of MONOS-Type Memories Akira Otake・○Keita Yamaguchi・Kenji Shiraishi(Univ. of Tsukuba.)
(6) 16:05-16:20 The optimum physical targets of the 3-dimensional vertical FG NAND flash memory cell arrays with the extended sidewall control gate (ESCG) structure ○Moon-Sik Seo(Tohoku Univ.)・Tetsuo Endoh(Tohoku Univ./JST)
(7) 16:20-16:35 New Method for Evaluating the Scaling Trend of Nano-Electro-Mechanical (NEM) Nonvolatile Memory Cells ○Seung Hyeun Roh・Woo Young Choi(Sogang Univ.)
  16:35-16:40 休憩 ( 5分 )
  16:40-16:50 委員長挨拶 ( 10分 )
7月2日(金) 午前  -Session 6B : Wide Bandgap Materials and Devices, Power Devices-
09:30 - 11:35
(1) 09:30-09:55 [招待講演]Development of Low on-resistance SiC Trench MOSFET and other SiC power devices ○Yuki Nakano・Ryota Nakamura・Katsuhisa Nagao・Takashi Nakamura・Hidemi Takasu(ROHM)
(2) 09:55-10:10 Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors ○Jaegil Lee・Chun-Hyung Cho・Ho-Young Cha(Hongik Univ.)
(3) 10:10-10:35 [招待講演]InAlN/GaN HEMT Structures on 4-in Silicon Grown by MOCVD ○Makoto Miyoshi・Shigeaki Sumiya・Mikiya Ichimura・Tomohiko Sugiyama・Sota Maehara・Mitsuhiro Tanaka(NGK)・Takashi Egawa(Nagoya Inst. of Tech.)
(4) 10:35-10:50 A comparative study on AlGaN/GaN based HEMT and MIS-HEMT with Al2O3 as gate dielectric ○Joseph Freedsman・Arata Watanabe・Lawrence Selvaraj・Takashi Egawa(Nagoya Inst. of Tech.)
(5) 10:50-11:05 Characterization of deep electron levels of AlGaN grown by MOVPE ○Kimihito Ooyama(Hokkaido Univ./SMM)・Katsuya Sugawara(Hokkaido Univ.)・Hiroyuki Taketomi・Hideto Miyake・Kazumasa Hiramatsu(Mie Univ.)・Tamotsu Hashizume(Hokkaido Univ./JST)
(6) 11:05-11:20 Characteristics of GaN p-n diode with damage layer induced by ICP plasma process ○Tsutomu Uesugi・Tetsu Kachi(Toyota Central R&D Labs.)・Tamotsu Hashizume(Hokkaido Univ.)
  11:20-11:35 休憩 ( 15分 )
7月2日(金) 午前  -Session 7B : Si IC and Circuit Technology-
11:35 - 14:15
(1) 11:35-11:50 The Impact of Current Controlled-MOS Current Mode Logic /Magnetic Tunnel Junction Hybrid Circuit for Stable and High-speed Operation ○Tetsuo Endoh・Masashi Kamiyanagi・Masakazu Muraguchi・Takuya Imamoto・Takeshi Sasaki(Tohoku Univ.)
(2) 11:50-12:05 Verification of Stable Circuit Operation of 180nm Current Controlled MOS Current Mode Logic under Threshold Voltage Fluctuation ○Masashi Kamiyanagi・Takuya Imamoto・Takeshi Sasaki・Hyoungjun Na・Tetsuo Endoh(Tohoku Univ.)
(3) 12:05-12:20 A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process ○Jae-Young Park・Dae-Woo Kim・Young-San Son・Jong-Chan Ha・Jong-Kyu Song・Chang-Soo Jang・Won-Young Jung(Dongbu HiTek)
(4) 12:20-12:35 A Precision Floating-Gate Mismatch Measurement Technique for Analog Applications ○Won-Young Jung・Jong Min Kim・Jin-Soo Kim・Taek-Soo Kim(Dongbu HiTek)
(5) 12:35-12:50 A Physical-Based Modeling for Accurate Wide-Width LDMOS ○Won-Young Jung・Jong-Sub Lee・Eun-Jin Kim・Ki-Jung Park・San-Hun Kwak・Jin-Soo Kim・Taek-Soo Kim(Dongbu HiTek)
(6) 12:50-13:05 Over 1GHz High-Speed Current Pulse Generation Circuit for Novel Nonvolatile Memory Cells ○Tetsuo Endoh・Yasuhiko Suzuki・Takuya Imamoto・Hyoungjun Na(Tohoku Univ.)
  13:05-14:15 昼食 ( 70分 )
7月2日(金) 午後  -Session 8B : High Speed and High Frequency Applications 2-
14:15 - 15:30
(7) 14:15-14:30 A V-band Common-Source Low Noise Amplifier in 0.13 μm RFCMOS Technology ○Sung-Jin Kim・Dong-Hyun Kim・Jae-Sung Rieh(Korea Univ.)
(8) 14:30-14:45 A 0.18 um CMOS process 10-PAM transceiver for 10 Gigabit Ethernet ○Nayeon Cho・J K Jeong・J J Lee・J Burm(Sogang Univ.)
(9) 14:45-15:00 A Switched-Capacitor Integrator Using Dynamic Source-Follower Amplifiers ○Ryoto Yaguchi・Fumiyuki Adachi・Takao Waho(Sophia Univ.)
(10) 15:00-15:15 A Basic Study on RF Characteristics of Short Wavelength Comb-type Transmission Line on MMIC ○Jang-Hyeon Jeong・Young-Bae Park・Bo-Ra Jung・Jeong-Gab Ju・Eui-Hoon Jang・Chi-Hong Min・Seong-Il Hong・Suk-Youb Kang・Hong Seung Kim・Young Yun(Korea Maritime Univ.)
  15:15-15:30 休憩 ( 15分 )
7月2日(金) 午後  -Session 9B : Nano-Scale devices and Physics-
15:30 - 16:40
(1) 15:30-15:45 High Current Drivability FD-SOI CMOS with Low Source/Drain Series Resistance ○Yukihisa Nakao・Rihito Kuroda・Hiroaki Tanaka・Akinobu Teramoto・Shigetoshi Sugawa・Tadahiro Ohmi(Tohoku Univ.)
(2) 15:45-16:00 Study on Impurity Distribution Dependence of Electron-Dynamics in Vertical MOSFET ○Masakazu Muraguchi・Tetsuo Endoh(Tohoku Univ./JST)
(3) 16:00-16:15 Characteristic of Dual-Gate Single Electron Transistor (DG-SET) with extended channel using shallow doping and sidewall patterning for suppressing MOS current ○Joung-eob Lee・Kwon-Chil Kang・Jung Han Lee・Kim Kyung Wan・Byung-Gook Park(Seoul National Univ.)
(4) 16:15-16:30 Study on Collective Electron Motion in Si-Nano Dot Floating Gate MOS Capacitor ○Masakazu Muraguchi(Tohoku Univ.)・Yoko Sakurai・Yukihiro Takada・Shintaro Nomura・Kenji Shiraishi(Univ. of Tsukuba.)・Mitsuhisa Ikeda・Katsunori Makihara・Seiichi Miyazaki(Hiroshima Univ.)・Yasuteru Shigeta(Univ. of Hyogo)・Tetsuo Endoh(Tohoku Univ.)
  16:30-16:40 休憩 ( 10分 )

講演時間
一般講演発表 12 分 + 質疑応答 3 分
招待講演発表 20 分 + 質疑応答 5 分
基調講演発表 35 分 + 質疑応答 5 分

問合先と今後の予定
ED 電子デバイス研究会(ED)   [今後の予定はこちら]
問合先 原 直紀 (富士通研究所)
TEL : 046-250-8242、FAX : 046-250-8168
E--mail : o
津田 邦男(東芝)
TEL : 044-549-2142、FAX : 044-520-1501
E--mail : oba
須原 理彦(首都大)
TEL : 042-677-2765 Fax : 042-677-2756
E--mail : t
上田 哲三(パナソニック)
TEL : 075-956-8273 Fax : 075-956-9110
E--mail : zopac 
SDM シリコン材料・デバイス研究会(SDM)   [今後の予定はこちら]
問合先 小野 行徳(NTT)
Phone 046-240-2641 Fax 046-240-4317
E--mail: oaecl 


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