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=============================================== Technical Committee on Reliability (R) Chair: Akira Asato (Fujitsu) Vice Chair: Tadashi Dohi (Hiroshima Univ.) Secretary: Nobuyuki Tamura (Hosei Univ.), Shinji Inoue (Kansai Univ.) Assistant: Hiroyuki Okamura (Hiroshima Univ.), Shinji Yokogawa (Univ. of Electro-Comm.) =============================================== Technical Committee on Electromechanical Devices (EMD) Chair: Shinichi Wada (TMC System) Vice Chair: Yoshiki Kayano (Univ. of Electro-Comm.) Secretary: Kenji Suzuki (Fuji Electric), Masato Mizukami (Muroran Inst. of Tech.) Assistant: Yuichi Hayashi (ＮＡＩＳＴ) DATE: Fri, Feb 14, 2020 13:30 - 15:55 PLACE: TOPICS: ---------------------------------------- Fri, Feb 14 PM (13:30 - 15:55) ---------------------------------------- ----- Opening Address ( 5 min. ) ----- (1) 13:35 - 14:00 Trend on standardization of Dependability -- Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan -- Hiroyuki Goto (FDK), Yoshinobu Sato (The IHQI, Tokyo Healthcare Foundation), Fumiaki Harada (D-Tech Partners), Yoshiki Kinoshita (Kanagawa University) (2) 14:00 - 14:25 Hardware security as a root of trust in information systems -- Focusing on EM information security -- Yuichi Hayashi (NAIST) ----- Break ( 10 min. ) ----- (3) 14:35 - 15:00 Observations of break arc behaviors of AgSnO2 contacts in a DC inductive load under application of an external magnetic field Makoto Hasegawa, Seika Tokumitsu (Chitose Inst. of Science & Technology) (4) 15:00 - 15:25 Forcible division of break arcs in small space occurring in a 150V-400VDC/10A resistive circuit by a dividing plate made of PTFE Yuichiro Kimura, Junya Sekikawa (Shizuoka Univ.) (5) 15:25 - 15:50 A Study on Design of Filter by Preference Set-based Design -- Evaluation of Robustness -- Yoshiki Kayano, Yoshio Kami, Fengchao Xiao (UEC) ----- Closing Address ( 5 min. ) ----- # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, May 29, 2020: Ehime University (Johoku Campus) [Mon, Mar 16], Topics: Software Reliability, Reliability General # SECRETARY: Shinji Inoue (Kansai Univ.) E-mail: i    n i-u === Technical Committee on Electromechanical Devices (EMD) === # FUTURE SCHEDULE: Fri, Mar 6, 2020: CHIBA Institute of Technology Tsudanuma Campus [Fri, Jan 17], Topics: Short NOTE Fri, May 15, 2020: , Topics: This workshop was postponed. Please see the new advance program here. # SECRETARY: Shin-ichi Wada(TMC) TEL +81-44-555-6171，FAX +81-44-211-4200 E-mail: s-   tm ys m Yoshiki Kayano(Univ. of Electro-Comm.) TEL&FAX +81-42-443-5233 E-mail: y   cMasato Mizukami(Muroran Institute of Technology) TEL&FAX +81-143-46-5307 E-mail: m-   mmm    n-itKenji Suzuki (Fuji Electric FA Components & Systems) TEL +81-48-547-1037，FAX +81-48-549-1825 E-mail:   -knj  elect c Yuichi Hayashi(NAIST) TEL +81-743-72-5390，FAX +81-743-72-5391 E-mail:  -i is ist # ANNOUNCEMENT: # Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ Last modified: 2019-12-23 17:29:42 |
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