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Technical Committee on Dependable Computing (DC)
Chair: Tatsuhiro Tsuchiya (Osaka Univ.) Vice Chair: Toshinori Hosokawa (Nihon Univ.)
Secretary: Masayuki Arai (Nihon Univ.), Kazuteru Namba (Chiba Univ.)

DATE:
Tue, Feb 28, 2023 11:00 - 17:05

PLACE:

TOPICS:

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Tue, Feb 28 AM (11:00 - 11:50)
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(1) 11:00 - 11:25

Takumi Sugioka, Yoshikazu Nagamura (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metropolitan Univ.)

(2) 11:25 - 11:50
A Test Generation Method to Distinguish Multiple Fault Pairs for Improvement of Fault Diagnosis Resolution
Yuya Chida, Toshinori Hosokawa (NIhon Univ.), Koji Yamazaki (Meiji Univ.)

----- Break ( 70 min. ) -----

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Tue, Feb 28 PM (13:00 - 14:15)
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(3) 13:00 - 13:25

Taito Asaji, Tatsuhiro Tsuchiya (Osaka Univ.)

(4) 13:25 - 13:50
A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints
Lele Jiang, Tatsuhiro Tsuchiya (Osaka Univ.)

(5) 13:50 - 14:15
Analysis of the Relationship between the Error Recovery and Reliability on Approximate Multipliers
Kozuma, Tamaki, Wang,Qilin, Ichihara, Hideyuki, Inoue, Tomoo (Hiroshima City Univ.)

----- Break ( 10 min. ) -----

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Tue, Feb 28 PM (14:25 - 15:40)
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(6) 14:25 - 14:50
Test Point Selection Method Using Graph Neural Networks and Deep Reinforcement Learning
Shaoqi Wei, Kohei Shiotani, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.)

(7) 14:50 - 15:15
A Don't-Care Filling Method of Control Signals on Controllers for Two-Pattern Concurrent Testing
Xu Haofeng, Hosokawa Toshinori (Nihon Univ.), Yoshimura Masayoshi (KSU), Arai Masayuki (Nihon Univ.)

(8) 15:15 - 15:40
A Seed Generation Method for Multiple Random Pattern Resistant Transition Faults for BIST
Yangling Xu, Rei Miura, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (KSU)

----- Break ( 10 min. ) -----

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Tue, Feb 28 PM (15:50 - 17:05)
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(9) 15:50 - 16:15
Stochastic flash ADC with variable input voltage range
Taira Sakaguchi, Satoshi Komatsu (Tokyo Denki Univ.)

(10) 16:15 - 16:40
A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability
Ruijun Ma (AUST), Stefan Holst, Xiaoqing Wen (KIT), Hui Xu (AUST), Aibin Yan (AU)

(11) 16:40 - 17:05
Effective Switching Probability Calculation to Locate Hotspots in Logic Circuit
Taiki Utsunomiya, Kohei Miyase, Ryu Hoshino (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.

=== Technical Committee on Dependable Computing (DC) ===
# FUTURE SCHEDULE:

Thu, Mar 23, 2023 - Sat, Mar 25, 2023: Amagi Town Disaster Prevention Center (Tokunoshima) [Mon, Jan 16]
Tue, May 9, 2023 - Wed, May 10, 2023:

# SECRETARY:
Masayuki Arai (College of Industrial Technology, Nihon Univ.)
E-mail: a