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Technical Committee on Reliability (R) [schedule] [select]
Chair Shigeru Yanagi (National Defense Academy)
Vice Chair Kazuaki Wakai (NHK)
Secretary Tetsushi Yuge (National Defense Academy), Mitsuhiro Kimura (Hosei Univ.)
Assistant Naoto Kaio (Hiroshima Shudo Univ.), Hisoyasu Mawatari (NTT)

Technical Committee on Electron Device (ED) [schedule] [select]
Chair Masaaki Kuzuhara (Univ. of Fukui)
Vice Chair Tamotsu Hashidume (Hokkaido Univ.)
Secretary Shin-ichiro Takatani (Hitachi), Manabu Arai (New JRC)
Assistant Naoki Hara (Fujitsu Labs.), Koichi Murata (NTT)

Technical Committee on Silicon Device and Materials (SDM) [schedule] [select]
Chair Tanemasa Asano (Kyushu Univ.)
Vice Chair Toshihiro Sugii (Fujitsu)
Secretary Shigeru Kawanaka (Toshiba), Hisahiro Anzai (Sony)
Assistant Syunichiro Ohmi (Tokyo Inst. of Tech.)

Conference Date Fri, Nov 16, 2007 13:00 - 16:35
Topics  
Conference Place Chuo-Denki-Kurabu 
Address 2-1-25, Doujimahama, Kita-ku, Osaka-shi, Japan
Transportation Guide 12 minutes walk from JR Osaka station, or 6 minutes walk from JR Kita-sinti station
http://www.chuodenki-club.or.jp/map/annai.html
Contact
Person
06-6345-6351
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Fri, Nov 16 PM 
13:00 - 16:35
(1) 13:00-13:25 Electrical Characterization of Yttriumaluminate(YAlO)Film R2007-46 ED2007-179 SDM2007-214 Keiko Matsunouchi, Naoyoshi Komatsu, Chiharu Kimura, Hidemitsu Aoki, Takashi Sugino (Osaka Univ.)
(2) 13:25-13:50 Galvanic Corrosion Suppression of High-k/Metal Gates R2007-47 ED2007-180 SDM2007-215 Daisuke Watanabe, Hidemitsu Aoki, Saori Hotta, Chiharu Kimura, Takashi Sugino (Osaka Univ)
(3) 13:50-14:15 Oxidation of SiC and GaN Surface in High Pressure and High Temperature Water R2007-48 ED2007-181 SDM2007-216 Takashi Futatsuki, Taro Oe (Organo Corp.), Hidemitsu Aoki, Naoyoshi Komatsu, Chiharu Kimura, Takashi Sugino (Osaka Univ.)
(4) 14:15-14:40 High Stability of Drain Current at High Temperatures in Multi-Mesa-Channel AlGaN/GaN HEMT R2007-49 ED2007-182 SDM2007-217 Takahiro Tamura, Junji Kotani, Kota Ohi, Tamotsu Hashizume (Hokkaido Univ.)
  14:40-14:55 Break ( 15 min. )
(5) 14:55-15:20 Reliability Study of AlGaN/GaN HEMTs Device R2007-50 ED2007-183 SDM2007-218 Keiichi Matsushita, Shinichiro Teramoto, Hiroyuki Sakurai, Jeoungchill Shim, Hisao Kawasaki, Kazutaka Takagi, Yoshiharu Takada, Kunio Tsuda (Toshiba)
(6) 15:20-15:45 Degradation-Mode Analysis for Highly Reliable GaN-HEMT R2007-51 ED2007-184 SDM2007-219 Yusuke Inoue, Satoshi Masuda, Masahito Kanamura, Toshihiro Ohki, Kozo Makiyama, Naoya Okamoto, Kenji Imanishi, Toshihide Kikkawa, Naoki Hara, Hisao Shigematsu, Kazukiyo Joshin (Fujitsu Labs. Ltd.)
(7) 15:45-16:10 Leakage Current Screening for AlGaN/GaN HEMT Mass-Production R2007-52 ED2007-185 SDM2007-220 Fumikazu Yamaki, Kazuaki Ishii, Masahiro Nishi, Hitoshi Haematsu, Yasunori Tateno, Haruo Kawata (EUD)
(8) 16:10-16:35 A New TDDB Degradation Model Based on Cu Ion Drift in Cu Interconnect Dielectrics R2007-53 ED2007-186 SDM2007-221 Naohito Suzumura, Shigehisa Yamamoto, , , Junko Komori, (Renesas Technology Corp.)

Announcement for Speakers
General Talk (25)Each speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Tetsushi Yuge (National Defense Academy)
TEL +81-46-841-3810
FAX +81-46-844-5903
E--mail: gen 
ED Technical Committee on Electron Device (ED)   [Latest Schedule]
Contact Address Manabu Arai(New JRC)
TEL: 049-278-1477、FAX: 049-278-1419
E--mail: injr
Shinichiro Takatani(Hitachi)
TEL: 049-278-1477、FAX: 049-278-1419
E--mail: er
Koichi Murata(NTT)
TEL:046-240-2871、FAX:046-270-2872
E--mailaecl
Hara Naoki (Fujitsu Lab.)
TEL : 046-250-8242、FAX : 046-250-4337
E--mail : nf 
SDM Technical Committee on Silicon Device and Materials (SDM)   [Latest Schedule]
Contact Address Yasushiro Nishioka (Nihon University, College of Science and Technology)
TEL047-469-6482,FAX047-467-9504
E--mail:etn-u,acmsk 


Last modified: 2007-09-25 11:35:28


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