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Technical Committee on Reliability (R) [schedule] [select]
Chair Hiroyasu Mawatari (NTT)
Vice Chair Tetsushi Yuge (National Defense Academy)
Secretary Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.)

Conference Date Thu, Nov 19, 2015 14:00 - 16:20
Topics  
Conference Place  
Sponsors This conference is co-sponsored by IEEE Reliability Society Japan Chapter and Kansai Branch of Reliability Engineering Association of Japan.

Thu, Nov 19 PM 
14:00 - 15:15
(1) 14:00-14:25 Reliability Analysis Based on Hierarchical Bayesian Models and Filtering Methodologies Toru Kaise (Univ. of Hyogo)
(2) 14:25-14:50 A Measurement Method for the Extent of Simultaneous Soft Errors Noboru Masuda, Moritoshi Yasunaga (Univ. of Tsukuba)
(3) 14:50-15:15 Observation of Power MOSFET under UIS avalanche breakdown condition using thermoreflectance image mapping Koichi Endo (Toshiba Corp.), Tomonori Nakamura (Hamamatsu Photonics K.K.), Koji Nakamae (Osaka Univ.)
  15:15-15:30 Break ( 15 min. )
Thu, Nov 19 PM 
15:30 - 16:20
(4) 15:30-15:55 A reliability test planning of electronic components for assurance of quality Toshinari Matsuoka (Mitsubishi Electric)
(5) 15:55-16:20 A Study on acceleration test for Life-End Evaluation Sadanori Ito (ITOKEN)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Hiroyuki Okamura (Hiroshima Univ.)
E--mail: l-u 


Last modified: 2015-10-27 11:07:10


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