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Technical Committee on Reliability (R)
Chair: Hiroyasu Mawatari (NTT) Vice Chair: Tetsushi Yuge (National Defense Academy)
Secretary: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant: Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.)

Thu, Nov 19, 2015 14:00 - 16:20



Thu, Nov 19 PM (14:00 - 15:15)

(1) 14:00 - 14:25
Reliability Analysis Based on Hierarchical Bayesian Models and Filtering Methodologies
Toru Kaise (Univ. of Hyogo)

(2) 14:25 - 14:50
A Measurement Method for the Extent of Simultaneous Soft Errors
Noboru Masuda, Moritoshi Yasunaga (Univ. of Tsukuba)

(3) 14:50 - 15:15
Observation of Power MOSFET under UIS avalanche breakdown condition using thermoreflectance image mapping
Koichi Endo (Toshiba Corp.), Tomonori Nakamura (Hamamatsu Photonics K.K.), Koji Nakamae (Osaka Univ.)

----- Break ( 15 min. ) -----

Thu, Nov 19 PM (15:30 - 16:20)

(4) 15:30 - 15:55
A reliability test planning of electronic components for assurance of quality
Toshinari Matsuoka (Mitsubishi Electric)

(5) 15:55 - 16:20
A Study on acceleration test for Life-End Evaluation
Sadanori Ito (ITOKEN)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.

- This conference is co-sponsored by IEEE Reliability Society Japan Chapter and Kansai Branch of Reliability Engineering Association of Japan.

=== Technical Committee on Reliability (R) ===

Fri, Dec 18, 2015: [Sun, Oct 18]
Fri, Feb 19, 2016: Azarea,Shizuoka [Fri, Dec 11]

Hiroyuki Okamura (Hiroshima Univ.)
E-mail: l-u

Last modified: 2015-10-27 11:07:10

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