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=============================================== Technical Committee on Reliability (R) Chair: Hiroyasu Mawatari (NTT) Vice Chair: Tetsushi Yuge (National Defense Academy) Secretary: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.) Assistant: Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.) DATE: Thu, Nov 19, 2015 14:00 - 16:20 PLACE: TOPICS: ---------------------------------------- Thu, Nov 19 PM (14:00 - 15:15) ---------------------------------------- (1) 14:00 - 14:25 Reliability Analysis Based on Hierarchical Bayesian Models and Filtering Methodologies Toru Kaise (Univ. of Hyogo) (2) 14:25 - 14:50 A Measurement Method for the Extent of Simultaneous Soft Errors Noboru Masuda, Moritoshi Yasunaga (Univ. of Tsukuba) (3) 14:50 - 15:15 Observation of Power MOSFET under UIS avalanche breakdown condition using thermoreflectance image mapping Koichi Endo (Toshiba Corp.), Tomonori Nakamura (Hamamatsu Photonics K.K.), Koji Nakamae (Osaka Univ.) ----- Break ( 15 min. ) ----- ---------------------------------------- Thu, Nov 19 PM (15:30 - 16:20) ---------------------------------------- (4) 15:30 - 15:55 A reliability test planning of electronic components for assurance of quality Toshinari Matsuoka (Mitsubishi Electric) (5) 15:55 - 16:20 A Study on acceleration test for Life-End Evaluation Sadanori Ito (ITOKEN) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by IEEE Reliability Society Japan Chapter and Kansai Branch of Reliability Engineering Association of Japan. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Dec 18, 2015: [Sun, Oct 18] Fri, Feb 19, 2016: Azarea,Shizuoka [Fri, Dec 11] # SECRETARY: Hiroyuki Okamura (Hiroshima Univ.) E-mail:     l     -u Last modified: 2015-10-27 11:07:10 |
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