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Technical Committee on Reliability (R)
Chair: Tadashi Dohi (Hiroshima Univ.) Vice Chair: Yasushi Kadota (Ricoh)
Secretary: Hiroyuki Okamura (Hiroshima Univ.), Shinji Inoue (Kansai Univ.)
Assistant: Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Takenori Sakumura (Housei Univ.)

Fri, Oct 22, 2021 13:00 - 16:15


Reliability of Information Communication System, Reliability General

Fri, Oct 22 PM (13:00 - 16:15)

(1) 13:00 - 13:25
Adversarial Attack Against COVID-19 CT Images Deep Learning System
Li Yang, Liu Ai, Liu Shaoying (HU)

(2) 13:25 - 13:50
A systematic method for identifying safety-related faults in formal specifications using FTA
Jiang Wen*, Liu Shaoying*, Liu Ai* (HU)

(3) 13:50 - 14:15
Modeling and prediction of injury occurrences of sumo wrestlers by using Hawkes process
Shuhei Ota (Kanagawa Univ.), Mitsuhiro Kimura (Hosei Univ.)

----- Break ( 10 min. ) -----

(4) 14:25 - 15:25
[Invited Talk]
Field Lifetime Data Analysis with Left-truncation and Right-censoring
-- Statistical Inference and Reliability Prediction based on Parametric Models --
Takeshi Emura (Kurume Univ.), Hirofumi Michimae (Kitasato Univ.)

(5) 15:25 - 15:50
A Note on Sensitivity Analysis of Software Rejuvenation Model with Markov Regenerative Process
Junjun Zheng (Ritsumeikan Univ.), Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)

(6) 15:50 - 16:15
A Note on Usability Error Analysis
Hiroko Matsubara, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.

- This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.

=== Technical Committee on Reliability (R) ===

Tue, Nov 30, 2021: Online [Tue, Sep 14], Topics: Reliability of semiconductor and electronic devices, Reliability ge
Sat, Dec 4, 2021: Online [Thu, Oct 14], Topics: Reliability International Standard, Maintainability, Reliability General, Safety General

Shinji Inoue (Kansai Univ.)

Last modified: 2021-08-18 11:44:49

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