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Technical Committee on Advanced Testing and Certification Technology for Radio Equipment (ACT) (Searched in: 2010)
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Search Results: Keywords 'from:2010-07-09 to:2010-07-09'
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[Go to Official ACT Homepage (Japanese)] |
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ACT (2nd) |
2010-07-09 13:30 |
Tokyo |
NICT Kohji-machi Office |
Near field distributions of horn antenna Akihiko Komatsuzaki, Hiroyuki Arai (Yokohama Natl. Univ.) |
[more] |
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ACT (2nd) |
2010-07-09 13:55 |
Tokyo |
NICT Kohji-machi Office |
Study of Measurement and Evaluation Method of Electromagnetic Field Radiated by Modulated Sources Qiang Chen, Toshiki Sayama, Kunio Sawaya (Tohoku Univ.) |
[more] |
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ACT (2nd) |
2010-07-09 14:20 |
Tokyo |
NICT Kohji-machi Office |
Influence of Probe Antenna Pattern on Far-Field Measurement by Synthetic Aperture Antenna Ryo Yamaguchi, Kazuhiro Komiya, Keizo Cho (NTT DOCOMO) |
[more] |
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ACT (2nd) |
2010-07-09 14:45 |
Tokyo |
NICT Kohji-machi Office |
Comparison of Total Radiated Power Measurements for Radio Equipment Integrated with Antenna Nozomu Ishii (Niigata Univ.) |
[more] |
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ACT (2nd) |
2010-07-09 15:10 |
Tokyo |
NICT Kohji-machi Office |
Analysis of the Influence of Element Position-Error on the Beam-Pattern of Synthetic Cylindrical Array Karlisa Priandana, Mir Ghoraishi, Jun-ichi Takada (Tokyo Tech), Michitaka Ameya, Satoru Kurokawa, Masanobu Hirose (AIST) |
This paper proposes a beam-forming method for semi-anechoic chamber (SAC) evaluation by utilizing a synthetic cylindrica... [more] |
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ACT (2nd) |
2010-07-09 15:35 |
Tokyo |
NICT Kohji-machi Office |
Development of RF Impedance Standards for EMC Test Instruments Masahiro Horibe, Masaaki Shida (NMIJ-AIST) |
In EMI receiver and artificial mains network (LISN/AMN), etc. the calibration of the input impedance and the insertion l... [more] |
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ACT (2nd) |
2010-07-09 16:00 |
Tokyo |
NICT Kohji-machi Office |
Evaluation of SVSWR over Entire Area of Turntable Using Automatic SVSWR Measurement System Michitaka Ameya, Satoru Kurokawa (AIST), Ikuo Watanabe, Mikito Yamaguchi, Ryoichi Hasumi (DEVICE) |
[more] |
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