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Technical Committee on Dependable Computing (DC) (Searched in: 2022)
Search Results: Keywords 'from:2023-02-28 to:2023-02-28'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2023-02-28 11:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Takumi Sugioka, Yoshikazu Nagamura (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metropolitan Univ.)  DC2022-82 |
[more] | DC2022-82 pp.1-5 |
| DC | 2023-02-28 11:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Test Generation Method to Distinguish Multiple Fault Pairs for Improvement of Fault Diagnosis Resolution Yuya Chida, Toshinori Hosokawa (NIhon Univ.), Koji Yamazaki (Meiji Univ.) DC2022-83 |
(To be available after the conference date) [more] | DC2022-83 pp.6-11 |
| DC | 2023-02-28 13:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Taito Asaji, Tatsuhiro Tsuchiya (Osaka Univ.) DC2022-84 |
(To be available after the conference date) [more] | DC2022-84 pp.12-15 |
| DC | 2023-02-28 13:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints Lele Jiang, Tatsuhiro Tsuchiya (Osaka Univ.) DC2022-85 |
This paper focuses on the problem of constraint representation for the generation of t-way test sequences. T-way seque... [more] |
DC2022-85 pp.16-20 |
| DC | 2023-02-28 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Analysis of the Relationship between the Error Recovery and Reliability on Approximate Multipliers Kozuma, Tamaki, Wang,Qilin, Ichihara, Hideyuki, Inoue, Tomoo (Hiroshima City Univ.) DC2022-86 |
[more] | DC2022-86 pp.21-26 |
| DC | 2023-02-28 14:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Test Point Selection Method Using Graph Neural Networks and Deep Reinforcement Learning Shaoqi Wei, Kohei Shiotani, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2022-87 |
It is well known that selecting the optimal test point to maximize the fault coverage is NP-hard. Conventional heuristic... [more] | DC2022-87 pp.27-32 |
| DC | 2023-02-28 14:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Don't-Care Filling Method of Control Signals on Controllers for Two-Pattern Concurrent Testing Xu Haofeng, Hosokawa Toshinori (Nihon Univ.), Yoshimura Masayoshi (KSU), Arai Masayuki (Nihon Univ.) DC2022-88 |
[more] | DC2022-88 pp.33-38 |
| DC | 2023-02-28 15:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Seed Generation Method for Multiple Random Pattern Resistant Transition Faults for BIST Yangling Xu, Rei Miura, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (KSU) DC2022-89 |
With shrinking feature sizes, growing clock frequencies, and decreasing power supply voltage, modern very large integrat... [more] | DC2022-89 pp.39-44 |
| DC | 2023-02-28 15:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Stochastic flash ADC with variable input voltage range Taira Sakaguchi, Satoshi Komatsu (Tokyo Denki Univ.) DC2022-90 |
In this study, a stochastic flash ADC with variable input voltage range is proposed. A stochastic flash ADC uses random ... [more] | DC2022-90 pp.45-50 |
| DC | 2023-02-28 16:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability Ruijun Ma (AUST), Stefan Holst, Xiaoqing Wen (KIT), Hui Xu (AUST), Aibin Yan (AU) DC2022-91 |
The continuous pursuing of smaller technology nodes makes modern Integrated Circuits (ICs) more and more susceptible to ... [more] | DC2022-91 pp.51-55 |
| DC | 2023-02-28 16:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Effective Switching Probability Calculation to Locate Hotspots in Logic Circuit Taiki Utsunomiya, Kohei Miyase, Ryu Hoshino (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2022-92 |
High power consumption in LSI testing may cause excessive IR-drop. When IR-drop becomes excessive, it causes excessive d... [more] | DC2022-92 pp.56-61 |
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