| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
Technical Committee on Electromechanical Devices (EMD) (Searched in: 2010)
Search Results: Keywords 'from:2010-12-17 to:2010-12-17'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD | 2010-12-17 13:00 |
Tokyo | Tamagawa University | Arc Duration at Opening Carbon Contacts
-- Comparison of Measured and Calculated Values at Opening Speed of about 0.9 m/s -- Keiichi Suhara (TNCT)  EMD2010-129 |
A study has been made on usability of Ayrton’s carbon arc V-I characteristics and the author’s arc V-I characteristics i... [more] | EMD2010-129 pp.1-4 |
| EMD | 2010-12-17 13:25 |
Tokyo | Tamagawa University | Magnetic Pulse Welding of Copper Foils without Using Driver (2nd Report) Tomokatsu Aizawa, Kazuo Matsuzawa, Keigo Okagawa (Tokyo Metropolitan College) EMD2010-130 |
This paper describes a copper foil welding technique by using magnetic pulse welding method without drivers and its expe... [more] | EMD2010-130 pp.5-10 |
| EMD | 2010-12-17 13:50 |
Tokyo | Tamagawa University | A Study on Lifetime and Reliability of Asymmetric Electrical Contact Pair Kazuaki Miyanaga, Yoshiki Kayano, Hiroshi Inoue (Akita Univ.) EMD2010-131 |
In order to develop the electrical contact with high reliability and long lifetime, it is necessary to examine the effec... [more] | EMD2010-131 pp.11-16 |
| EMD | 2010-12-17 14:30 |
Tokyo | Tamagawa University | Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Contact Resistance (14) -- Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Professor Emeritus Keio Univ/Nippon Inst. of Tech.) EMD2010-132 |
Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] | EMD2010-132 pp.17-22 |
| EMD | 2010-12-17 14:55 |
Tokyo | Tamagawa University | Vibration test of RF coaxial connectors using a tapping device with constant inpact-force Masaki Tomina, Daijiro Ishibashi, Nobuhiro Kuga (Yokohama Nat'l Univ.) EMD2010-133 |
In this report, passive intermodulation (PIM) generated in an asseembled cable with small connectors installed on a pane... [more] | EMD2010-133 pp.23-27 |
| EMD | 2010-12-17 15:20 |
Tokyo | Tamagawa University | A Consideration of the Correlation between Impedance-matched method and Impedance-mismatched method in terms of the Power Consumption by a PIM Source Sho Yoshida, Daijiro Ishibashi, Nobuhiro Kuga (Yokohama Nat'l Univ.) EMD2010-134 |
Although higher sensitivity of impedance matched methods than impedance-matched methods has been confirmed by experiment... [more] | EMD2010-134 pp.29-34 |
[Return to Top Page]