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Technical Committee on VLSI Design Technologies (VLD) (Searched in: 2010)
Search Results: Keywords 'from:2010-11-29 to:2010-11-29'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 10:40 |
Fukuoka | Kyushu University | Evaluation of frequency components of power noise in CMOS digital LSI Kumpei Yoshikawa, Hiroshi Matsumoto, Yuta Sasaki (Kobe Univ.), Makoto Nagata (Kobe Univ./CREST-JST)  CPM2010-124 ICD2010-83 |
Recent trends of electric devices are higher performance and/or lower power consumption. To achieve these designs, LSI ... [more] |
CPM2010-124 ICD2010-83 pp.1-6 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 11:00 |
Fukuoka | Kyushu University | Evaluation of on-chip power noise generation and injection in SRAM core Takuya Sawada, Taku Toshikawa, Tsubasa Masui (Kobe Univ.), Makoto Nagata (Kobe Univ./CREST-JST) CPM2010-125 ICD2010-84 |
The noise tolerance of SRAM was evaluated by evaluating the power supply noise generation, and injecting the RF noise i... [more] | CPM2010-125 ICD2010-84 pp.7-12 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 11:20 |
Fukuoka | Kyushu University | A Consideration of Substrate Noise Sensitivity of Analog Elements Satoshi Takaya, Yoji Bando, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) CPM2010-126 ICD2010-85 |
Measure substrate sensitivity of differential amplifiers in a 90 nm CMOS technology with more than 32 different geometor... [more] | CPM2010-126 ICD2010-85 pp.13-17 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 11:40 |
Fukuoka | Kyushu University | Evaluation of Signal-Integrity Improvement Capability of the Segmental Transmission Line
-- In Its Application to Lines Including Inductances -- Hiroki Shimada, Shohei Akita, Masami Ishiguro, Moritoshi Yasunaga, Noriyuki Aibe (Univ. of Tsukuba), Ikuo Yoshihara (Univ. of Miyazaki) CPM2010-127 ICD2010-86 |
In recent years, signal integrity(SI) is becoming very serious problem in the area of transmitting high-frequency-digita... [more] | CPM2010-127 ICD2010-86 pp.19-24 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 13:30 |
Fukuoka | Kyushu University | [Invited Talk]
Problems of on-chip interconnection and optical interconnection Shin Yokoyama, Yoshiteru Amemiya (Hiroshima Univ.) CPM2010-128 ICD2010-87 |
The problems of current LSI with metal interconnection are pointed out, i.e., increasing signal delay and power dissipat... [more] | CPM2010-128 ICD2010-87 pp.25-30 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 14:10 |
Fukuoka | Kyushu University | [Invited Talk]
Present Status and Target Issue of LSI-Chip Optical Interconnection Keishi Ohashi (MIRAI-Selete/NEC), Tohru Mogami (MIRAI-Selete) CPM2010-129 ICD2010-88 |
On-chip optical interconnection is expected to give an answer to the problems on signal integrity and data band width. C... [more] | CPM2010-129 ICD2010-88 pp.31-36 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 15:00 |
Fukuoka | Kyushu University | [Invited Talk]
Research Trends and Future Directions for Optical Interconnects Technologies Toshiki Sugawara, Yasunobu Matsuoka, Shin-ichi Saito, Naoki Matsushima, Shinji Tsuji (Hitachi) CPM2010-130 ICD2010-89 |
The increasing of the recent internet traffic requires the high-speed transmission intra equipment of ICT equipment, lik... [more] | CPM2010-130 ICD2010-89 pp.37-42 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 15:40 |
Fukuoka | Kyushu University | [Invited Talk]
Trend of the ESD design technology of the advanced semiconductor devices Hiroyasu Ishizuka (Renesas) |
[more] | |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 13:30 |
Fukuoka | Kyushu University | An Approach to Translate from Mathematical to Electronic Descriptions of Image Processing Algorithm for ITS Yukio Fujita, Masanori Tsuzuki, Yoshiya Sugita, Masahiro Fukui (Ritsumeikan Univ.) VLD2010-57 DC2010-24 |
Technology advances in automotive technology have been driven by electronic engineering, especially image recognition te... [more] | VLD2010-57 DC2010-24 pp.1-6 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 13:50 |
Fukuoka | Kyushu University | Rapid SoC Prototyping Based on Virtual Multi-Processor Model Hiroaki Yoshida, Masahiro Fujita (Univ. of Tokyo/JST) VLD2010-58 DC2010-25 |
To meet both high performance and high energy efficiency, System-on-Chip (SoC) has a heterogenous architec- ture includi... [more] | VLD2010-58 DC2010-25 pp.7-12 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 14:10 |
Fukuoka | Kyushu University | A Scalable Heuristic for Incremental High-Level Synthesis Shohei Ono (Univ. Tokyo), Hiroaki Yoshida, Masahiro Fujita (Univ. of Tokyo/JST) VLD2010-59 DC2010-26 |
Recently, high-level synthesis techniques have been widely used to achieve high design productivity by enabling a desig... [more] |
VLD2010-59 DC2010-26 pp.13-18 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 14:50 |
Fukuoka | Kyushu University | A Binding Algorithm for Multi-cycle Fault Tolerant Datapaths Hayato Henmi, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) VLD2010-60 DC2010-27 |
As the advance in semiconductor technology, the issue of soft errors, which are transient glitches caused by particle st... [more] | VLD2010-60 DC2010-27 pp.25-30 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 15:25 |
Fukuoka | Kyushu University | Evaluation of Multi-Cycle Test with Partial Observation in Scan BIST Structure Hisato Yamaguchi, Makoto Matsuzono, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech./JST) VLD2010-61 DC2010-28 |
Reducing test data volume is important for field BIST because the data should be stored on a chip. In this paper, for th... [more] | VLD2010-61 DC2010-28 pp.31-36 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 15:45 |
Fukuoka | Kyushu University | A decision method of target detected pseudo primary outputs on Low-capture-swithing-activity test generation Yang Shen, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushu Univ) VLD2010-62 DC2010-29 |
High launch switching activity in capture mode during at-speed scan testing may lead to excessive IR-drop. Excessive IR-... [more] | VLD2010-62 DC2010-29 pp.37-42 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 16:05 |
Fukuoka | Kyushu University | Rotating Test and Pattern Partitioning for Field Test Senling Wang, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Insti. Tech.) |
[more] | |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 16:25 |
Fukuoka | Kyushu University | Experimental Evaluation of Built-in Test Pattern Generation with Image Decoders Yuka Iwamoto, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) VLD2010-63 DC2010-30 |
Built-in Self Test (BIST) is one of effective methods for testing today's very large-scale SoCs.In BIST scheme, a t... [more] | VLD2010-63 DC2010-30 pp.43-48 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-30 09:10 |
Fukuoka | Kyushu University | 17 Gb/s VCSEL Driver Using Double-Pulse Asymmetric Emphasis Technique for Optical Interconnection Takaya Taniguchi, Kiichi Yamashita, Kenichi Ohhata (Kagoshima Univ.), Norio Chujo, Toru Yazaki (Hitachi) CPM2010-131 ICD2010-90 |
This paper describes the design and experimental results of a 17 Gb/s vertical-cavity surface-emitting laser (VCSEL) dri... [more] | CPM2010-131 ICD2010-90 pp.43-47 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-30 09:30 |
Fukuoka | Kyushu University | Improvement and Evaluation of via programmable structured ASIC VPEX Ryohei Hori, Tatsuya Kitamori, Taisuke Ueoka (Ritsumeikan Univ.), Masaya Yoshikawa (Meijo Univ.), Takeshi Fujino (Ritsumeikan Univ.) CPM2010-132 ICD2010-91 |
[more] | CPM2010-132 ICD2010-91 pp.49-54 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-30 09:50 |
Fukuoka | Kyushu University | An estimation of a dynamic partial reconfiguration capability of a dynamic optically reconfigurable gate array Amarjargal Gundjalam, Minoru Watanabe (Shizuoka Univ.) CPM2010-133 ICD2010-92 |
[more] | CPM2010-133 ICD2010-92 pp.55-60 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-30 10:25 |
Fukuoka | Kyushu University | [Invited Talk]
System Performance Improvement Expected for 3D LSI Chip Stacking Integration Technology Masahiro Aoyagi (AIST) CPM2010-134 ICD2010-93 |
3D LSI chip stacking integration technology using through-Si-via is very promising for future electronic hardware integr... [more] | CPM2010-134 ICD2010-93 pp.61-65 |
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