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Technical Committee on Reliability (R) [schedule] [select]
Chair Yasushi Kadota (Ricoh)
Vice Chair Hiroyuki Okamura (Hiroshima Univ.)
Secretary Takenori Sakumura (Hosei Univ.), Shinji Inoue (Kansai Univ.)
Assistant Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Shuhei Ota (Kanagawa Univ.)

Conference Date Fri, Nov 3, 2023 13:30 - 16:45
Topics Reliability of semiconductor and electronic devices, Reliability general 
Conference Place Seminar Room 1C, The Kanazawa Chamber of Commerce and Industry 
Address 9-13, Oyama-cho, Kanazawa-shi, Ishikawa 920-8639, Japan
Transportation Guide
Shinji Inoue
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R.

Fri, Nov 3 PM 
13:30 - 16:45
(1) 13:30-13:55 An Optimal Maintenance Policy for Safety-Related Systems Based on a Continuous-Time Markov Chain R2023-44 Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.)
(2) 13:55-14:20 A Study on Preventive Maintenance Policy under Limited Information about Failure Time R2023-45 Yasuhiko Takemoto (KINDAI Univ.), Ikuo Arizono (Okayama Univ.)
(3) 14:20-14:45 Optimal Maintenance Policy for a Markovian Deteriorating System under Random Operating Environment R2023-46 Nobuyuki Tamura (Hosei Univ.)
  14:45-14:55 Break ( 10 min. )
(4) 14:55-15:20 Bayesian reliability analysis based on the lognormal distribution R2023-47 Toru Kaise (Univ. of Hyogo)
(5) 15:20-15:45 Formulation of Process Safety Time and Function Accomplishment Time for Assessment of SOTIF R2023-48 Yoshinobu Sato (Institute of HQI)
  15:45-15:55 Break ( 10 min. )
(6) 15:55-16:45 [Invited Talk]
A Positioning Problem in Lamp Systems Considering System Reliability R2023-49
Won Young Yun (PNU)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Shinji Inoue (Kansai Univ.)
E--mail: ini-u 

Last modified: 2023-09-11 14:28:33

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