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Technical Committee on Reliability (R) [schedule] [select]
Chair Akira Asato (Fujitsu)
Vice Chair Tadashi Dohi (Hiroshima Univ.)
Secretary Nobuyuki Tamura (Hosei Univ.), Shinji Inoue (Kansai Univ.)
Assistant Hiroyuki Okamura (Hiroshima Univ.), Shinji Yokogawa (Univ. of Electro-Comm.)

Conference Date Mon, Nov 30, 2020 13:00 - 16:10
Topics Reliability of semiconductor and electronic devices, Reliability general 
Conference Place Online 
Prof. Shinji Inoue
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R.

Mon, Nov 30 PM 
13:00 - 16:10
(1) 13:00-13:25 Ant Colony Optimization Algorithm Based on Birnbaum Importance and Necessary Condition for Optimal Arrangement Problems in a Linear Consecutive-k-out-of-n: F System R2020-23 Issin Honma, Hisashi Yamamoto (Tokyo Metropolitan Univ.), Taishin Nakamura (Tokai Univ.)
(2) 13:25-13:50 On Software Safety Integrity Assessment for E/E/PE Safety-Related Systems R2020-24 Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab. Inc.), Shigeru Yamada (Tottori Univ.)
(3) 13:50-14:15 R2020-25
  14:15-14:30 Break ( 15 min. )
(4) 14:30-14:55 Verification of effect by comparison of temperature cycle test and thermal shock test R2020-26 Yuri Saito, Matsuguma Osamu, Aoki Yuichi (ESPEC)
(5) 14:55-15:20 Analysis for Degraded MLCC Using Voltage Contrast Method in SEM R2020-27 Akira Saito (Murata)
(6) 15:20-15:45 Stochastic Modeling and Filtering for Reliability Predictions of Degradation Processes R2020-28 Toru Kaise (Univ. of Hyogo)
(7) 15:45-16:10 A Study for Accelerated Humidity Stress Test (part 3) R2020-29 Sadanori Itou (Itoken)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Shinji Inoue (Kansai Univ.)
E--mail: ini-u 

Last modified: 2020-10-02 18:08:58

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